Real time x‐ray studies of rapidly annealed epitaxial layers
- Lowe, Walter P.
- Clarke, Roy
- Dos Passos, Waldemar
- Rodricks, Brian G.
- Brizard, Christine
Publication date
January 1992
DOI Publisher
AIP Publishing ISSN
0034-6748 Language
English Citation count (estimate)
2Abstract
Time‐resolved x‐ray scattering studies of epitaxial overlayers are presented. The results illustrate the usefulness of high‐brightness synchrotron probes for studying the cooperative kinetics of interfaces during rapid thermal processing.Peer Reviewedhttp://deepblue.lib.umich.edu/bitstream/2027.42/70481/2/RSINAK-63-1-704-1.pd
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