Add to ORKGPrinciple of NC-AFM / F. J. Giessibl. - In: Noncontact atomic force microscopy / S. Morita ... (ed.). - Berlin u.a. : Springer, 2002. - S. 11-46. - (Nanoscience and technology). - (Physics and astronomy online library
The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
AFM; cantilever; noncontact atomic force microscopy (NC-AFM); Q-factor; thermal excitation; resonanc...
Principle of NC-AFM / F. J. Giessibl. - In: Noncontact atomic force microscopy / S. Morita ... (ed.)...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on...
The atomic force microscope (AFM) is a member of the family of scanning probe microscopes, which mak...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Nanotechnology tools, such as Atomic Force Microscopy (AFM), are now becoming widely used in life sc...
In this thesis, four major results novel to the field of NC-AFM, are introduced. First, the force cu...
Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the inve...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
Atomic force microscopy (AFM) is a technique wherein an atomically sharp needle raster scans across ...
The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
AFM; cantilever; noncontact atomic force microscopy (NC-AFM); Q-factor; thermal excitation; resonanc...
Principle of NC-AFM / F. J. Giessibl. - In: Noncontact atomic force microscopy / S. Morita ... (ed.)...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Principle of high-resolution atomic force microscopy / F. J. Giessibl. – In: Fundamentals of nanoele...
This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on...
The atomic force microscope (AFM) is a member of the family of scanning probe microscopes, which mak...
This book presents the latest developments in noncontact atomic force microscopy. It deals with the ...
The atomic force microscope (AFM) is a very high-resolution type of Scanning Probe Microscopy (SPM)....
Nanotechnology tools, such as Atomic Force Microscopy (AFM), are now becoming widely used in life sc...
In this thesis, four major results novel to the field of NC-AFM, are introduced. First, the force cu...
Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the inve...
The technique of Atomic Force Microscopy (AFM) is one of the major inventions of the twentieth centu...
Atomic force microscopy (AFM) is a technique wherein an atomically sharp needle raster scans across ...
The atomic force microscope (AFM) has become one of the leading nanoscale measurement techniques for...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
AFM; cantilever; noncontact atomic force microscopy (NC-AFM); Q-factor; thermal excitation; resonanc...