Add to ORKGAFM; cantilever; noncontact atomic force microscopy (NC-AFM); Q-factor; thermal excitation; resonance; spectral analysis; stiffnes
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often s...
frequency-modulation atomic force microscopy; force deconvolution; numerical implementatio
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of i...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Different methods for the determination of cantilever properties in non-contact atomic force microsc...
Principle of NC-AFM / F. J. Giessibl. - In: Noncontact atomic force microscopy / S. Morita ... (ed.)...
atomic force microscopy; multifrequency imaging; nanomechanical characterization; photothermal excit...
This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on...
atomic force microscopy (AFM); frequency-modulated atomic force microscopy (FM-AFM); energy dissipat...
This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), t...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency fn, q...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
Understanding the modal response of an atomic force microscope is important for the identification o...
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often s...
frequency-modulation atomic force microscopy; force deconvolution; numerical implementatio
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...
The atomic force microscope (AFM) system has evolved into a useful tool for direct measurements of i...
Noncontact atomic force microscopy and its related topics / F. J. Giessibl ... - In: Springer handbo...
Different methods for the determination of cantilever properties in non-contact atomic force microsc...
Principle of NC-AFM / F. J. Giessibl. - In: Noncontact atomic force microscopy / S. Morita ... (ed.)...
atomic force microscopy; multifrequency imaging; nanomechanical characterization; photothermal excit...
This chapter presents an overview of Atomic Force Microscopy (AFM) principles followed by details on...
atomic force microscopy (AFM); frequency-modulated atomic force microscopy (FM-AFM); energy dissipat...
This chapter shortly reviews the scientific background of Atomic Force Acoustic Microscopy (AFAM), t...
Since it was invented by Binnig et al in 1986, atomic force microscopy (AFM) has played a crucial ro...
We critically discuss the extraction of intrinsic cantilever properties, namely eigenfrequency fn, q...
Atomic force microscopy (AFM) has become a key enabling technology for high-precision study of mater...
Understanding the modal response of an atomic force microscope is important for the identification o...
Dynamic techniques exploiting the vibration of atomic force microscope (AFM) cantilevers are often s...
frequency-modulation atomic force microscopy; force deconvolution; numerical implementatio
Atomic force microscopy (AFM) employs microfabricated cantilevers as sensing elements, which are use...