Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's behavior. This has motivated the design of an array of techniques to detect, isolate, and correct soft errors using microarchitectural, architectural, compilationbased, or application-level techniques to minimize their impact on the executing application. The first step toward the design of good error detection/correction techniques involves an understanding of an application's vulnerability to soft errors. This work focuses on silent data e orruption's effects on iterative solvers and efforts to mitigate those effects. In this thesis, we first present the first comprehensive characterizalion of !he impact of soft errors on !he convergen ...
Resilient algorithms in high-performance computing are subject to rigorous non-functional constrain...
With shrinking device size and increasing complexity, soft errors are becoming an issue in the relia...
Continuous improvements in transistor scaling together with microarchitectural advances have made po...
Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
Understanding the impact of soft errors on applications can be expensive. Often, it requires an exte...
The rising count and shrinking feature size of transistors within modern computers is making them in...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
ELLIOTT III, JAMES JOHN. Resilient Iterative Linear Solvers Running Through Errors. (Under the direc...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Traditionally, fault tolerance researchers have made very strict assumptions about program correctne...
Resilient algorithms in high-performance computing are subject to rigorous non-functional constrain...
With shrinking device size and increasing complexity, soft errors are becoming an issue in the relia...
Continuous improvements in transistor scaling together with microarchitectural advances have made po...
Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
Soft errors are faults which are not caused by defective hardware, rather they are induced due to no...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
Understanding the impact of soft errors on applications can be expensive. Often, it requires an exte...
The rising count and shrinking feature size of transistors within modern computers is making them in...
The complexity of integrated system on-chips as well as commercial processor’s architecture has incr...
ELLIOTT III, JAMES JOHN. Resilient Iterative Linear Solvers Running Through Errors. (Under the direc...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
Traditionally, fault tolerance researchers have made very strict assumptions about program correctne...
Resilient algorithms in high-performance computing are subject to rigorous non-functional constrain...
With shrinking device size and increasing complexity, soft errors are becoming an issue in the relia...
Continuous improvements in transistor scaling together with microarchitectural advances have made po...