As the capacity of cache increases dramatically with new processors, soft errors originating in cache has become a major reliability concern for high performance processors. This paper presents application specific soft error vulnerability analysis in order to understand an application's responses to soft errors from different levels of caches. Based on a high-performance processor simulator called Graphite, we have implemented a fault injection framework that can selectively inject bit flips to different levels of caches. We simulated a wide range of relevant bit error patterns and measured the applications' vulnerabilities to bit errors. Our experimental results have shown the various vulnerabilities of applications to bit errors from dif...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...
As the capacity of cache increases dramatically with new processors, soft errors originating in cach...
textDependability and fault tolerance are important aspects of modern computer systems. Particle str...
This paper presents an empirical investigation on the soft error sensitivity (SES) of microprocessor...
Continuous technology scaling has brought us to a point, where transistors have become extremely sus...
Soft errors (also called transient errors, or single event upsets) are one of the vital errors that ...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
International audienceStatic raw soft-error rates (SER) of COTS microprocessors are classically obta...
2012-01-31Benchmarking the FIT (failures in time of 1E9 hours) rates of caches due to soft errors is...
Soft errors caused by transient bit flips have the potential to significantly impactan applicalion's...
Instruction and data caches are well known architectural solutions that allow significantly improvin...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Soft errors are a growing concern for processor reliability. Recent work has motivated architecture ...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
dissertationCurrent scaling trends in transistor technology, in pursuit of larger component counts a...
The problem of soft errors caused by radiation events are expected to get worse with technology scal...