Oxygen transport during thermal oxidation of Ge and desorption of the formed Ge oxide are investigated. Higher oxidation temperatures and lower oxygen pressures promote GeO desorption. An appreciable fraction of oxidized Ge desorbs during the growth of a GeO2 layer. The interplay between oxygen desorption and incorporation results in the exchange of O originally present in GeO2 by O from the gas phase throughout the oxide layer. This process is mediated by O vacancies generated at the GeO2/Ge interface. The formation of a substoichiometric oxide is shown to have direct relation with the GeO desorption
The relations between physical structural transformations and improvement of electrical properties o...
In analogy with the case of Sr on Si [Y. Liang, S. Gan, M. Engelhard, Appl. Phys. Lett. 79 (2001) 35...
Ge is a promising material to improve transistor performance. However, finding an efficient passivat...
The thermal stability of GeO2 formed by oxygen implantation into Si0.5Ge0.5 alloy has been investiga...
The activation energy of GeO2 was studied by determining the oxide thickness versus temperature fr...
We have studied Ge gate stacks for many years, and demonstrated very interesting properties in Ge [1...
The stability of oxygen vacancies across the Ge-HfO2 interface is studied through semilocal and hybr...
High resolution X-ray photoelectron spectroscopy (XPS) was used to analyze thin layers of germanium ...
High resolution X-ray Photoelectron Spectroscopy (XPS) was used to analyze thin layers of germanium ...
Density functional modeling is used to show that germanium oxidation occurs by the diffusion of netw...
The oxidation of SiGe layers grown by molecular beam epitaxy was studied. Auger depth profile showed...
Deuterium (D) incorporation in GeO2/Ge structures following D2 annealing was investigated. Higher D ...
Adsorbed species and its diffusion behaviors in GeO_2/Ge stacks, which are future alternative metal-...
The mechanism of oxygen incorporation in Ag is still poorly known. As recently demonstrated [Phys. R...
Electron cyclotron resonance (ECR) plasma oxidation of SiGe alloys was investigated at temperatures ...
The relations between physical structural transformations and improvement of electrical properties o...
In analogy with the case of Sr on Si [Y. Liang, S. Gan, M. Engelhard, Appl. Phys. Lett. 79 (2001) 35...
Ge is a promising material to improve transistor performance. However, finding an efficient passivat...
The thermal stability of GeO2 formed by oxygen implantation into Si0.5Ge0.5 alloy has been investiga...
The activation energy of GeO2 was studied by determining the oxide thickness versus temperature fr...
We have studied Ge gate stacks for many years, and demonstrated very interesting properties in Ge [1...
The stability of oxygen vacancies across the Ge-HfO2 interface is studied through semilocal and hybr...
High resolution X-ray photoelectron spectroscopy (XPS) was used to analyze thin layers of germanium ...
High resolution X-ray Photoelectron Spectroscopy (XPS) was used to analyze thin layers of germanium ...
Density functional modeling is used to show that germanium oxidation occurs by the diffusion of netw...
The oxidation of SiGe layers grown by molecular beam epitaxy was studied. Auger depth profile showed...
Deuterium (D) incorporation in GeO2/Ge structures following D2 annealing was investigated. Higher D ...
Adsorbed species and its diffusion behaviors in GeO_2/Ge stacks, which are future alternative metal-...
The mechanism of oxygen incorporation in Ag is still poorly known. As recently demonstrated [Phys. R...
Electron cyclotron resonance (ECR) plasma oxidation of SiGe alloys was investigated at temperatures ...
The relations between physical structural transformations and improvement of electrical properties o...
In analogy with the case of Sr on Si [Y. Liang, S. Gan, M. Engelhard, Appl. Phys. Lett. 79 (2001) 35...
Ge is a promising material to improve transistor performance. However, finding an efficient passivat...