© 2016 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works.[EN] Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the threshold voltage, which causes slower transistor switching and eventually results in timing violations and faulty operation. This effect appears when the memory cell contents flip from logic '0' to '1' and vice versa. In caches, the majority of cell flips are concen...
Power dissipation is increasingly important in CPUs rang-ing from those intended for mobile use, all...
Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-c...
In this paper, we show that the vulnerability of memory components due to data retention in the pres...
Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the thres...
[EN] Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleteri...
Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious e...
Simulator code, input files and example command lines to evaluate two techniques for reducing HCI ag...
One of the most effective techniques to reduce a processor\u27s power consumption is to reduce suppl...
Since array structures represent well over half the area and transistors on-chip, maintaining their ...
© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the main rel...
IEEE Computer Society Annual Symposium on VLSI : April 7-9, 2008 : Montpellier, FranceThe share of l...
©2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for al...
Decreasing power consumption in small devices such as handhelds, cell phones and high-performance pr...
This paper proposes a novel adaptable and reliable L1 data cache design (Adapcache) with the unique ...
Power dissipation is increasingly important in CPUs rang-ing from those intended for mobile use, all...
Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-c...
In this paper, we show that the vulnerability of memory components due to data retention in the pres...
Over the lifetime of a microprocessor, the Hot Carrier Injection (HCI) phenomenon degrades the thres...
[EN] Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleteri...
Hot carrier injection (HCI) and bias temperature instability (BTI) are two of the main deleterious e...
Simulator code, input files and example command lines to evaluate two techniques for reducing HCI ag...
One of the most effective techniques to reduce a processor\u27s power consumption is to reduce suppl...
Since array structures represent well over half the area and transistors on-chip, maintaining their ...
© 2015 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for a...
Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the main rel...
IEEE Computer Society Annual Symposium on VLSI : April 7-9, 2008 : Montpellier, FranceThe share of l...
©2013 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for al...
Decreasing power consumption in small devices such as handhelds, cell phones and high-performance pr...
This paper proposes a novel adaptable and reliable L1 data cache design (Adapcache) with the unique ...
Power dissipation is increasingly important in CPUs rang-ing from those intended for mobile use, all...
Voltage scaling to values near the threshold voltage is a promising technique to hold off the many-c...
In this paper, we show that the vulnerability of memory components due to data retention in the pres...