Increasing microprocessor vulnerability to soft errorsind))F by neutron and alpha particle strikes prevents aggressive scaling and integration of transistors in future technologies if left unadaU ssed Previously proposed instruction-level redU(] nt execution, as a means of dzFF(zUx errors, su#ers from a severe performance loss ds to the resource shortage caused by the large number of redUFz nt instructions injected into the superscalar core. In this paper, we propose to apply three architectural enhancements, namely 1) floating-point unit sharing (F S), 2) prioritizing primary instructions (PRI), and 3) early retiring of redUflR nt instructions (ERT), that enable transient-faultd etecting redzFF nt execution in supers...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Previous proposals for soft-error tolerance have called for redundantly executing a program as two c...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Abstract- Instruction-level redundancy is an effective scheme to reduce the susceptibility of microp...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
The negative impact of the aggressive scaling of technology nodes on the sensitivity of CMOS devices...
Previous proposals for soft-error tolerance have called for redundantly executing a program as two c...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
Soft errors are an important challenge in contemporary microprocessors. Particle hits on the compone...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
The occurrence of transient faults like soft errors in computer circuits poses a significant challen...
Abstract- Instruction-level redundancy is an effective scheme to reduce the susceptibility of microp...
Successive generations of processors use smaller transistors in the quest to make more powerful comp...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
The sustained drive to downsize the transistors has reached a point where device sensitivity against...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...