Previous proposals for soft-error tolerance have called for redundantly executing a program as two concurrent threads on a superscalar microarchitecture. In a balanced superscalar design, the extra workload from redundant execution induces a severe performance penalty due to increased contention for resources throughout the datapath. This paper identifies and analyzes four key factors that affect the performance of redundant execution, namely 1) issue bandwidth and functional unit contention, 2) issue queue and reorder buffer capacity contention, 3) decode and retirement bandwidth contention, and 4) coupling between redundant threads' dynamic resource requirements. Based on this analysis, we propose the SHREC microarchitecture for asymmetri...
Increasing microprocessor vulnerability to soft errorsind))F by neutron and alpha particle strike...
Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft e...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical Engineering, 2008.Continued scaling of...
Previous proposals for soft-error tolerance have called for redundantly executing a program as two c...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
Journal ArticleRedundant multi-threading (RMT) has been proposed as an architectural approach that ...
Simultaneous Multithreading (SMT) has been proposed for improving processor throughput by overlappin...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Journal ArticleModern superscalar processors use wide instruction issue widths and out-of-order exe...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
Abstract- Instruction-level redundancy is an effective scheme to reduce the susceptibility of microp...
Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have i...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
To protect processor logic from soft errors, multicore redundant architectures execute two copies of...
Increasing microprocessor vulnerability to soft errorsind))F by neutron and alpha particle strike...
Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft e...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical Engineering, 2008.Continued scaling of...
Previous proposals for soft-error tolerance have called for redundantly executing a program as two c...
Soft error tolerance is a hot research topic for modern microprocessors. We have been investigating ...
Journal ArticleRedundant multi-threading (RMT) has been proposed as an architectural approach that ...
Simultaneous Multithreading (SMT) has been proposed for improving processor throughput by overlappin...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Journal ArticleModern superscalar processors use wide instruction issue widths and out-of-order exe...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
Abstract- Instruction-level redundancy is an effective scheme to reduce the susceptibility of microp...
Journal ArticleNoise and radiation-induced soft errors (transient faults) in computer systems have i...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
To protect processor logic from soft errors, multicore redundant architectures execute two copies of...
Increasing microprocessor vulnerability to soft errorsind))F by neutron and alpha particle strike...
Journal ArticleDue to shrinking transistor sizes and lower supply voltages, transient faults (soft e...
Thesis (Ph. D.)--University of Rochester. Dept. of Electrical Engineering, 2008.Continued scaling of...