The paper is dealing with the in-field test of the decode unit of RISC processors through functional test programs following the SBST approach. The paper details a strategy based on instruction classification and manipulation, and signatures collection. The method does not require the knowledge of detailed implementation information (e.g., the netlist), but is based on the Instruction Set of the processor. The proposed method is evaluated on an industrial SoC device, which includes a PowerPC derived processor. Results demonstrate the efficiency and effectiveness of the strategy; the proposed solution reaches over 90% of stuck-at fault coverage while an instruction coverage based approach does not overcome 70%
The growing usage of electronic systems in safety-critical applications requires effective solutions...
Beside external test and hardware Built-In Self-Test tech-niques, a non-intrusive low-cost strategy ...
Electronic systems are increasingly used for safety-critical applications, where the effects of faul...
The paper is dealing with the in-field test of the decode unit of RISC processors through functional...
When the result of a previous instruction is needed in the pipeline before it is available, a “data ...
When the result of a previous instruction is needed in the pipeline before it is available, a “data ...
A Branch Target Buffer (BTB) is a mechanism to support speculative execution in order to overcome th...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
Functional test and software-based self-test (SBST) approaches for processors are becoming popular a...
Abstract—Software-based self-test (SBST) is a promising new technology for at-speed testing of embed...
The growing usage of electronic systems in safety- and mission-critical applications, together wi...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
Software-Based Self-Test (SBST) approaches have shown to be an effective solution to detect permane...
Software-based self-testing (SBST) has been touted as the effective way to test the processors effec...
Branch prediction units (BPUs) are highly efficient modules that can significantly decrease the nega...
The growing usage of electronic systems in safety-critical applications requires effective solutions...
Beside external test and hardware Built-In Self-Test tech-niques, a non-intrusive low-cost strategy ...
Electronic systems are increasingly used for safety-critical applications, where the effects of faul...
The paper is dealing with the in-field test of the decode unit of RISC processors through functional...
When the result of a previous instruction is needed in the pipeline before it is available, a “data ...
When the result of a previous instruction is needed in the pipeline before it is available, a “data ...
A Branch Target Buffer (BTB) is a mechanism to support speculative execution in order to overcome th...
Software-based self-test (SBST) techniques are used to test processors and processor cores against p...
Functional test and software-based self-test (SBST) approaches for processors are becoming popular a...
Abstract—Software-based self-test (SBST) is a promising new technology for at-speed testing of embed...
The growing usage of electronic systems in safety- and mission-critical applications, together wi...
AbstractIn this paper, we present a number of algorithms to test the instruction decoding function o...
Software-Based Self-Test (SBST) approaches have shown to be an effective solution to detect permane...
Software-based self-testing (SBST) has been touted as the effective way to test the processors effec...
Branch prediction units (BPUs) are highly efficient modules that can significantly decrease the nega...
The growing usage of electronic systems in safety-critical applications requires effective solutions...
Beside external test and hardware Built-In Self-Test tech-niques, a non-intrusive low-cost strategy ...
Electronic systems are increasingly used for safety-critical applications, where the effects of faul...