Due to performance issues commercial off the shelf components are becoming more and more appealing in application fields where fault tolerant computing is mandatory. As a result, to cope with the intrinsic unreliability of such components against certain fault types like those induced by ionizing radiations, cost-effective fault tolerant architectures are needed. In this paper we present an in-depth experimental evaluation of a hybrid architecture to detect transient faults affecting microprocessors. The architecture leverages an hypervisor-based task-level redundancy scheme that operates in conjunction with a custom-developed hardware module. The experimental evaluation shows that our lightweight redundancy scheme is able to effectively co...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
As predicted by Gordon E. Moore in 1975, the number of transistors has doubled every two years over ...
This paper deals with a software modification strategy allowing on-line detection of transient error...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
International audienceThis paper presents a non-intrusive hybrid fault detection approach that combi...
International audienceA non-intrusive and reconfigurable approach that combines hardware and softwar...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
Increasing vulnerability of transistors and interconnects due to scaling is continuously challenging...
Critical applications based on Systems-on-Chip (SoCs) require suitable techniques that are able to e...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
As MOS device sizes continue shrinking, lower charges, for example those charges carried by single i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
As predicted by Gordon E. Moore in 1975, the number of transistors has doubled every two years over ...
This paper deals with a software modification strategy allowing on-line detection of transient error...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
International audienceThis paper presents a non-intrusive hybrid fault detection approach that combi...
International audienceA non-intrusive and reconfigurable approach that combines hardware and softwar...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
Increasing vulnerability of transistors and interconnects due to scaling is continuously challenging...
Critical applications based on Systems-on-Chip (SoCs) require suitable techniques that are able to e...
With continued CMOS scaling, future shipped hardware will be increasingly vulnerable to in-the-field...
Microprocessor-based systems are employed in an increasing number of applications where dependabilit...
As MOS device sizes continue shrinking, lower charges, for example those charges carried by single i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
As predicted by Gordon E. Moore in 1975, the number of transistors has doubled every two years over ...
This paper deals with a software modification strategy allowing on-line detection of transient error...