Critical applications based on Systems-on-Chip (SoCs) require suitable techniques that are able to ensure a sufficient level of reliability. Several techniques have been proposed to improve fault detection and correction capabilities of faults affecting SoCs. This paper proposes a hybrid approach able to detect and correct the effects of transient faults in SoC data memories and caches. The proposed solution combines some software modifications, which are easy to automate, with the introduction of a hardware module, which is independent of the specific application. The method is particularly suitable to fit in a typical SoC design flow and is shown to achieve a better trade-off between the achieved results and the required costs than corres...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
Hardening SoCs against transient faults requires new techniques able to combine high fault detection...
International audienceThis paper presents a non-intrusive hybrid fault detection approach that combi...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
Due to performance issues commercial off the shelf components are becoming more and more appealing i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
This paper deals with a software modification strategy allowing on-line detection of transient error...
International audienceThis paper deals with a software modification strategy allowing on-line detect...
Abstract. This work-in-progress paper surveys error detection techniques for transient, timing, perm...
ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI ...
Commercial off-the-shelf (COTS) components are increasingly being employed in embedded systems due t...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
Hardening SoCs against transient faults requires new techniques able to combine high fault detection...
International audienceThis paper presents a non-intrusive hybrid fault detection approach that combi...
This paper presents a non-intrusive hybrid fault detection approach that combines hardware and softw...
As chip densities and clock rates increase, processors are becoming more susceptible to transient fa...
Transient faults became an increasing issue in the past few years as smaller geometries of newer, hi...
Due to performance issues commercial off the shelf components are becoming more and more appealing i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
This paper deals with a software modification strategy allowing on-line detection of transient error...
International audienceThis paper deals with a software modification strategy allowing on-line detect...
Abstract. This work-in-progress paper surveys error detection techniques for transient, timing, perm...
ISBN: 0818663073This paper addresses the detection of permanent or transient faults in complex VLSI ...
Commercial off-the-shelf (COTS) components are increasingly being employed in embedded systems due t...
IC technologies are approaching the ultimate limits of silicon in terms of channel width, power supp...
With the advent of VLSI technology, the systems fabricated in deep sub micron technology are more pr...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...