Electron paramagnetic resonance (EPR) and electron-nuclear double resonance (ENDOR) studies have been performed on single crystals of aluminum nitride (AlN) and zinc oxide (ZnO), two wide-band-gap semiconductors having the wurtzite crystal structure. These studies were used to characterize point defects in each material. In the first study in AlN, new EPR and ENDOR spectra were acquired from a deep donor. Although observed in as-grown crystals, exposure to x rays significantly increased the concentration of this center. ENDOR identified a strong hyperfine interaction with one aluminum neighbor along the c axis and weaker equivalent hyperfine interactions with three additional aluminum neighbors in the basal plane. These aluminum interaction...