In making wavelength determinations to the accuracy of one-thousandth of an Angstrom with a Fabry and Perot Etalon it is necessary to know the wavelength of the line to one-tenth of an Angstrom, the thickness of the etalon and the change of phase on reflection of the light from the interfaces of the etalon. This change of phase is a function of the wavelength, varies with the metal, the way it is deposited and with the surface upon which it is deposited. A separate determination must be made for each etalon. This change of phase is usually expressed as a correction applied to the wave length determination
One describes an apparatus, consisting essentially of a Michelson interferometer, which measures by ...
The plasmonic phenomenon of Extraordinary Optical Transmission (EOT) refers to the interaction of th...
The term analysis of the complex rare earth and heavy element spectra requires highly accurate descr...
In making wavelength determinations to the accuracy of one-thousandth of an Angstrom with a Fabry an...
The first quantitative investigation of absolute phase change was made by Quinckel in 1872. This was...
Phase change on reflection affects many precision dimensional measurements. The phase change can res...
The phenomenon of the phase change of light on reflection from partially reflecting metal films depo...
For the calculation of phase shift accompanying reflection from a thin film on base medium, the auth...
The use and analysis of solid Fabry-Perot etalons for interferometry and laser control are discussed...
The theory of the etalon used in refleclion shows that the phase change on reflection from the secon...
Des phases intermédiaires, ayant une anisotropie uniaxiale, sont caractérisées par les parties réell...
We describe a simple experiment which allows unequivocal determination of optical phase change upon ...
Because the phase shift on reflection is a function of the optical properties, it provides an excell...
Abstraet. — In order to determine the optical properties of thin layers, a method has been set up fo...
The authors have measured thicknesses of silver thin films by using fringes of equal chromatic order...
One describes an apparatus, consisting essentially of a Michelson interferometer, which measures by ...
The plasmonic phenomenon of Extraordinary Optical Transmission (EOT) refers to the interaction of th...
The term analysis of the complex rare earth and heavy element spectra requires highly accurate descr...
In making wavelength determinations to the accuracy of one-thousandth of an Angstrom with a Fabry an...
The first quantitative investigation of absolute phase change was made by Quinckel in 1872. This was...
Phase change on reflection affects many precision dimensional measurements. The phase change can res...
The phenomenon of the phase change of light on reflection from partially reflecting metal films depo...
For the calculation of phase shift accompanying reflection from a thin film on base medium, the auth...
The use and analysis of solid Fabry-Perot etalons for interferometry and laser control are discussed...
The theory of the etalon used in refleclion shows that the phase change on reflection from the secon...
Des phases intermédiaires, ayant une anisotropie uniaxiale, sont caractérisées par les parties réell...
We describe a simple experiment which allows unequivocal determination of optical phase change upon ...
Because the phase shift on reflection is a function of the optical properties, it provides an excell...
Abstraet. — In order to determine the optical properties of thin layers, a method has been set up fo...
The authors have measured thicknesses of silver thin films by using fringes of equal chromatic order...
One describes an apparatus, consisting essentially of a Michelson interferometer, which measures by ...
The plasmonic phenomenon of Extraordinary Optical Transmission (EOT) refers to the interaction of th...
The term analysis of the complex rare earth and heavy element spectra requires highly accurate descr...