The continuous-slow-down approximation (CSDA) is used to create a simple composite analytical formula to estimate the range or maximum penetration depth of bombarding electrons into traditional materials including conductors, semiconductors, and insulators. This formula generates an approximation to the range using a single fitting parameter, Nv, described as the effective number of valence electrons. This applicability of the formulation extends to electrons with energies from 10MeV. These calculations are of great value for studies of high electron bombardment, such as electron spectroscopy or the vacuum of space. A list comprised of 187 materials has been collected that greatly extends the applicability of this model. Several key materia...
International audienceThe Secondary Electron Emission (SEE) process plays an important role in the p...
In this paper it was performed a comparison the standard characteristics of depth-dose distributions...
A database for efficiently computing the electron Stark broadening line widths for atomic N, O, and ...
The continuous-slow-down approximation (CSDA) is used to create a simple composite analytical formul...
The Continuous-Slow-Down Approximation (CSDA) is used to create a simple composite analytical formul...
The penetration range of an electron into diverse materials can be estimated using an approximation ...
The penetration range of energetic electrons into diverse materials can be modeled approximately wit...
A simple composite analytic expression has been developed to approximate the electron range in mater...
A model developed by the Materials Research Group that calculates electron penetration range of some...
An empirical model developed by the Materials Research Group that predicts the approximate electron ...
The electron range is a measure of the straight-line penetration distance of electrons in a solid [1...
Empirical correlation of high energy electrons into materials allows predictions of practical ranges...
An empirical model that predicts the approximate electron penetration depth—or range—of some common ...
Secondary Electron Yield is a key parameter in spacecraft charging. In order to develop a robust mod...
Power and charge deposition in multilayer dielectrics from electron bombardment is dependent upon th...
International audienceThe Secondary Electron Emission (SEE) process plays an important role in the p...
In this paper it was performed a comparison the standard characteristics of depth-dose distributions...
A database for efficiently computing the electron Stark broadening line widths for atomic N, O, and ...
The continuous-slow-down approximation (CSDA) is used to create a simple composite analytical formul...
The Continuous-Slow-Down Approximation (CSDA) is used to create a simple composite analytical formul...
The penetration range of an electron into diverse materials can be estimated using an approximation ...
The penetration range of energetic electrons into diverse materials can be modeled approximately wit...
A simple composite analytic expression has been developed to approximate the electron range in mater...
A model developed by the Materials Research Group that calculates electron penetration range of some...
An empirical model developed by the Materials Research Group that predicts the approximate electron ...
The electron range is a measure of the straight-line penetration distance of electrons in a solid [1...
Empirical correlation of high energy electrons into materials allows predictions of practical ranges...
An empirical model that predicts the approximate electron penetration depth—or range—of some common ...
Secondary Electron Yield is a key parameter in spacecraft charging. In order to develop a robust mod...
Power and charge deposition in multilayer dielectrics from electron bombardment is dependent upon th...
International audienceThe Secondary Electron Emission (SEE) process plays an important role in the p...
In this paper it was performed a comparison the standard characteristics of depth-dose distributions...
A database for efficiently computing the electron Stark broadening line widths for atomic N, O, and ...