Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and spectroscopic tool since its invention in 1986. At its present state of development, however, the interpretation of AFM images is limited by the current state of methodologies for calibration over the wide dynamic range of magnification. Also, the parameters of individual tips, as well as the generic characteristics of different kinds of tips, affect both the quality of the images and their interpretation. Finally, the very nature of the tip‐to‐surface interaction will generate artefacts, in addition to those associated with tip shape, which need to be fully understood by the practitioners of force microscopy. This project seeks to address a...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
International audienceConstant‐force atomic force microscopy (AFM) images of the muscovite mica surf...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of e...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
The Atomic Force Microscope (AFM) plays a key role in various disciplines, providing a versatile too...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
International audienceConstant‐force atomic force microscopy (AFM) images of the muscovite mica surf...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
This Ph.D. project is aimed at developing and validating techniques for successful use of Atomic For...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Bluntness of tips of atomic force microscopy (AFM) probes may affect the precision of AFM measuremen...
Atomic force microscopy (AFM) is probably the most celebrated technique falling into the family of e...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...
International audienceThe estimation of a mechanically affected zone (MAZ) during AFM force measurem...