grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative and quantitative images of a sample's topography. Unfortunately, the imaging process suffers from distortions due to geometric interactions when the sample size range is comparable with that of the AFM tip, specifically from 2 to 500 nm, which is typical for colloids and biological systems. This thesis identifies these distortions, presents some examples, and provides some solutions to the predicament. Two simple numerical procedures for separating the probe tip geometry from images obtained by AFM are presented. The procedures described are of general applicability: they make no assumptions about the tip geometry and require no pre-treatment o...
Atomic force microscopy (AFM) measurements could be affected by different kinds of artifacts; some o...
It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides u...
One major drawback identified in atomic force microscopy imaging is the dependence of the image's pr...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
Atomic force microscopy, AFM, is a powerful tool that can produce detailed topographical images of i...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
Using a simple computer simulation for AFM imaging in the contact mode, the convolu-tion eect is dem...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
Atomic force microscope (AFM) images contain distortions induced by the finite size of the tip. Reco...
Currently used imaging methods in Atomic Force Microscopy (AFM) including the use of a Lock-In Ampli...
Precision measurements of a nanoscale sample surface using an atomic force microscope (AFM) require ...
As the tip in the atomic force microscope is scanned over the sample surface an image results which ...
Colloidal gold particles are used as hard, spherical imaging targets to assist in the reconstruction...
It is demonstrated that due to inevitable intrinsic imperfections in the microfabrication process of...
Atomic force microscopy (AFM) measurements could be affected by different kinds of artifacts; some o...
It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides u...
One major drawback identified in atomic force microscopy imaging is the dependence of the image's pr...
grantor: University of TorontoThe atomic force microscope (AFM) allows both qualitative an...
Atomic force microscopy, AFM, is a powerful tool that can produce detailed topographical images of i...
It is a well‐known fact in scanning probe microscopy that the tip geometry will be convoluted with t...
Using a simple computer simulation for AFM imaging in the contact mode, the convolu-tion eect is dem...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
Atomic force microscopy (AFM), in various versions, has had major impact as a surface structural and...
Atomic force microscope (AFM) images contain distortions induced by the finite size of the tip. Reco...
Currently used imaging methods in Atomic Force Microscopy (AFM) including the use of a Lock-In Ampli...
Precision measurements of a nanoscale sample surface using an atomic force microscope (AFM) require ...
As the tip in the atomic force microscope is scanned over the sample surface an image results which ...
Colloidal gold particles are used as hard, spherical imaging targets to assist in the reconstruction...
It is demonstrated that due to inevitable intrinsic imperfections in the microfabrication process of...
Atomic force microscopy (AFM) measurements could be affected by different kinds of artifacts; some o...
It has been demonstrated that atomic force microscopy imaging with CO-functionalized tips provides u...
One major drawback identified in atomic force microscopy imaging is the dependence of the image's pr...