Add to ORKGA spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of wavelengths and a detector with multiple detector elements for simultaneous monitoring of a number of wavelengths in an environmental control chamber which optionally provides for secured sample entry, and methodology of use
To measure characteristics such as density and particle-size distributions of a medium that interact...
In an ellipsometer, a phase-modulated, polarized light beam is applied to a sample, electrical signa...
A sample system investigation system, such as an ellipsometer or polarimeter system, for use in inve...
A spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of w...
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electr...
Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-U...
A rotating compensator spectroscopic ellipsometer or polarimeter system having a source of a polychr...
A sample sequestering system which allows access to a subspace in a chamber encompassed generally en...
A substantially self-contained on-board material system investigation system for effecting relativ...
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a bea...
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an e...
A substantially self-contained “on-boar ” material system investigation system functionally mounted ...
Quasi-achromatic multi-element lens(es) which are precisely mounted with respect to one another in a...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention is applicable generally to Spectroscopic Rotatable and Rotating Element Ellips...
To measure characteristics such as density and particle-size distributions of a medium that interact...
In an ellipsometer, a phase-modulated, polarized light beam is applied to a sample, electrical signa...
A sample system investigation system, such as an ellipsometer or polarimeter system, for use in inve...
A spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of w...
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electr...
Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-U...
A rotating compensator spectroscopic ellipsometer or polarimeter system having a source of a polychr...
A sample sequestering system which allows access to a subspace in a chamber encompassed generally en...
A substantially self-contained on-board material system investigation system for effecting relativ...
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a bea...
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an e...
A substantially self-contained “on-boar ” material system investigation system functionally mounted ...
Quasi-achromatic multi-element lens(es) which are precisely mounted with respect to one another in a...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention is applicable generally to Spectroscopic Rotatable and Rotating Element Ellips...
To measure characteristics such as density and particle-size distributions of a medium that interact...
In an ellipsometer, a phase-modulated, polarized light beam is applied to a sample, electrical signa...
A sample system investigation system, such as an ellipsometer or polarimeter system, for use in inve...