Add to ORKGQuasi-achromatic multi-element lens(es) which are precisely mounted with respect to one another in a tubular mounting fixture, and the application thereof in focusing, (and optionally re-colliminating), a spectroscopic electromagnetic beam into a very small, chromatically relatively undispersed, area spot on a material system
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an e...
A system for sequentially providing electromagnetic radia tion to a spot on a sample at different an...
To sense characteristics of a sample, an ellipsometer includes a pivotal diffraction grating positio...
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electr...
Disclosed are spectroscopic ellipsometer systems which include polarizer and analyzer elements which...
A rotating compensator spectroscopic ellipsometer or polarimeter system having a source of a polychr...
Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-U...
A substantially self-contained “on-boar ” material system investigation system functionally mounted ...
A spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of w...
A substantially self-contained on-board material system investigation system for effecting relativ...
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a bea...
Sytems and mehtods for providing and enhancing electromagnetic radiation beam radail energy homogene...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention relates to ellipsometer systems, and more particularly to ellipsometer systems...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an e...
A system for sequentially providing electromagnetic radia tion to a spot on a sample at different an...
To sense characteristics of a sample, an ellipsometer includes a pivotal diffraction grating positio...
A spectroscopic ellipsometer or polarimeter system having a source of a polychromatic beam of electr...
Disclosed are spectroscopic ellipsometer systems which include polarizer and analyzer elements which...
A rotating compensator spectroscopic ellipsometer or polarimeter system having a source of a polychr...
Disclosed are improvements in ellipsometer and the like systems capable of operating in the Vacuum-U...
A substantially self-contained “on-boar ” material system investigation system functionally mounted ...
A spectrophotometer, ellipsometer or polarimeter or the like system with a spectroscopic source of w...
A substantially self-contained on-board material system investigation system for effecting relativ...
Disclosed is a system for enabling easy sequential setting of different Angles-of-Incidence of a bea...
Sytems and mehtods for providing and enhancing electromagnetic radiation beam radail energy homogene...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention relates to ellipsometer systems, and more particularly to ellipsometer systems...
An ellipsometer system which includes a pivotal dispersive optics positioned to receive polychromati...
The present invention relates to ellipsometer and polarimeter systems, and more particularly is an e...
A system for sequentially providing electromagnetic radia tion to a spot on a sample at different an...
To sense characteristics of a sample, an ellipsometer includes a pivotal diffraction grating positio...