We report on the metallization on passivating contacts by screen-printed metal pastes. The passivating contact consists of a thermal SiOx layer of 1 to 2 nm thickness, in combination with an in-situ boron doped low pressure chemical vapor deposited polysilicon layer of 300 nm thickness. After thermal annealing, SiNx deposition and contact firing, we find extremely low dark saturation current densities down to 1 fA/cm2. Using a commercially available high temperature fire through Ag paste, which is applied by conventional screen printing technology, we achieve a specific contact resistance c = 2 mΩcm2. This makes the application interesting as rear side contact of industrial type high-efficiency p-type solar cells
\u3cp\u3eWe present a detailed material study of n\u3csup\u3e+\u3c/sup\u3e-type polysilicon (polySi)...
This work demonstrates low-ohmic electrical contacting of phosphorus- and boron-doped surfaces (text...
In this work, we present the development of passivating contacts based on thin interfacial oxide/dop...
We investigate contacting of n- and p-type polysilicon (polySi) passivating contact layers with indu...
We investigate contacting of n- and p-type polysilicon (polySi) passivating contact layers with indu...
We have metallised n+ polysilicon passivated layer structures deposited by Low Pressure Chemical Vap...
In this article, we investigate the passivation quality and electrical contact properties for sample...
In this work, we report on hole selective passivating contacts, which consist of a SiOx tunnel layer...
The state-of-the-art low-ohmic electrical contacting of highly boron-doped silicon surfaces is based...
AbstractAdvanced solar cell contacts feature local contacts to p- and p+- Si. In this review existin...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
\u3cp\u3eWe present a detailed material study of n\u3csup\u3e+\u3c/sup\u3e-type polysilicon (polySi)...
This work demonstrates low-ohmic electrical contacting of phosphorus- and boron-doped surfaces (text...
In this work, we present the development of passivating contacts based on thin interfacial oxide/dop...
We investigate contacting of n- and p-type polysilicon (polySi) passivating contact layers with indu...
We investigate contacting of n- and p-type polysilicon (polySi) passivating contact layers with indu...
We have metallised n+ polysilicon passivated layer structures deposited by Low Pressure Chemical Vap...
In this article, we investigate the passivation quality and electrical contact properties for sample...
In this work, we report on hole selective passivating contacts, which consist of a SiOx tunnel layer...
The state-of-the-art low-ohmic electrical contacting of highly boron-doped silicon surfaces is based...
AbstractAdvanced solar cell contacts feature local contacts to p- and p+- Si. In this review existin...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
We present a detailed material study of n+-type polysilicon (polySi) and its application as a carrie...
\u3cp\u3eWe present a detailed material study of n\u3csup\u3e+\u3c/sup\u3e-type polysilicon (polySi)...
This work demonstrates low-ohmic electrical contacting of phosphorus- and boron-doped surfaces (text...
In this work, we present the development of passivating contacts based on thin interfacial oxide/dop...