Crystallographic data and refinement information.
- Beat Nyfeler (118890)
- Dominic Hoepfner (179967)
- Deborah Palestrant (308324)
- Christina A. Kirby (308326)
- Lewis Whitehead (308329)
- Robert Yu (29013)
- Gejing Deng (308332)
- Ruth E. Caughlan (308333)
- Angela L. Woods (308334)
- Adriana K. Jones (308336)
- S. Whitney Barnes (57211)
- John R. Walker (105748)
- Swann Gaulis (308337)
- Ervan Hauy (308338)
- Saskia M. Brachmann (138553)
- Philipp Krastel (308339)
- Christian Studer (308340)
- Ralph Riedl (308341)
- David Estoppey (308342)
- Thomas Aust (308343)
- N. Rao Movva (308344)
- Zuncai Wang (94281)
- Michael Salcius (308345)
- Gregory A. Michaud (308346)
- Gregory McAllister (308348)
- Leon O. Murphy (118915)
- John A. Tallarico (308350)
- Christopher J. Wilson (308352)
- Charles R. Dean (308355)
Publication date
February 2013
DOIAbstract
a<p>Numbers in parenthesis are for the highest resolution shell (3.06-2.90).</p>b<p>R<sub>sym</sub> = Σ|I<sub>h</sub>−h>|/ΣI<sub>h</sub> over all h, where I<sub>h</sub> is the intensity of reflection h.</p>c<p>R<sub>cryst</sub> and R<sub>free</sub> = Σ∥F<sub>o</sub>|−|F<sub>c</sub>∥/Σ|F<sub>o</sub>|, where F<sub>o</sub> and F<sub>c</sub> are observed and calculated amplitudes, respectively. Rfree was calculated using 5% of data excluded from the refinement.</p
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