Fit of FDS-SV data at 3258 nM EGFP acquired at a focal depth of 8000 μm.

<p>For clarity only 3^rd scan and 3^rd data point are shown. (A) Fit and residuals of a model without any FDS-specific corrections with standard <i>c</i>(<i>s</i>), allowing for TI noise (black line). The rmsd of the fit is 17.61 counts. (B) Fit with the same <i>c</i>(<i>s</i>) sedimentation model but additionally including the corrections for radial magnification gradients with best-fit <i>dε</i>/<i>dr</i> = 0.0071 cm⁻¹, temporal intensity drifts with best-fit <i>dε</i>/<i>dt</i> of 2.44%/h, a shadow at the bottom of the cell with radius <i>δ</i> = 0.183 cm, and a radial convolution of σ = 0.03 cm. The rmsd of this fit is 4.96 counts. (C) Sedimentation coefficient distributions resulting from the fit in (A) shown in blue as dotted line, and from the fit in (B) shown in purple as solid line.