One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM only has one sharp tip as the end-effector, and can only apply a point force to the nanoobject, which makes it extremely difficult to achieve a stable manipulation. For example, the AFM tip tends to slip-away during nanoparticle manipulation due to its small touch area, and there is no available strategy to manipulate a nanorod in a constant posture with a single tip since the applied point force can make the nanorod rotate more easily. In this paper, a robotic nano-hand method is proposed to solve these problems. The basic idea is using a single tip to mimic the manipulation effect that multi-AFM tip can achieve through the planned high speed ...
For robotic nanomanipulation based on an atomic force microscope (AFM), the working principle of int...
In developing nano-devices and nano-structures, traditional methodologies on MEMS meet the difficult...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparti...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many year...
For robotic nanomanipulation based on an atomic force microscope (AFM), the working principle of int...
In developing nano-devices and nano-structures, traditional methodologies on MEMS meet the difficult...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparti...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Nanomanipulation using Atomic Force Microscope (AFM) has been extensively investigated for many year...
For robotic nanomanipulation based on an atomic force microscope (AFM), the working principle of int...
In developing nano-devices and nano-structures, traditional methodologies on MEMS meet the difficult...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparti...