One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparticle can be stable controlled within a known area, while this prerequisite is still hindered by the uncertainties including the initial position of the nanoparticle and of the AFM tip, together with the uncertain forces from the substrate and so on. In this paper, a Stochastic Pushing (SP) model and a Stable Pushing Strategy are proposed respectively, which can push the nanoparticle into a bounded target area within a given probability. Simulations and experiment based on the proposed SP model demonstrate the validity of the Stable Pushing Strategy
This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparti...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
The reliability of AFM based nanomanipulation is one of the prerequisites for nano fabricating, thus...
Automating the task of nanomanipulation is extremely important since it is tedious for humans. This ...
The reliability of AFM based nanomanipulation is one of the prerequisites for nano fabricating, thus...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...
One of the prerequisites for AFM based nanomanipulation is that the position of the target nanoparti...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM) based nanoparticle pushing is that AF...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
One of the major limitations for Atomic Force Microscopy (AFM)-based nanomanipulation is that AFM on...
The reliability of AFM based nanomanipulation is one of the prerequisites for nano fabricating, thus...
Automating the task of nanomanipulation is extremely important since it is tedious for humans. This ...
The reliability of AFM based nanomanipulation is one of the prerequisites for nano fabricating, thus...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
Atomic force microscopy (AFM) has become a promising tool for not only imaging and measuring matter ...
This paper proposes an atomic force microscope (AFM) based force controller to push nanoparticles on...
Atomic force microscopy (AFM) is originally used to observe the sample surface, and then extended to...
Atomic force microscopy (AFM) (Binning et al., Phys Rev Lett 56:930–933, 1986) has been used as a na...