The increasing gap between processor and main memory speeds has become a serious bottleneck towards further improvement in system performance. Data prefetching techniques have been proposed to hide the performance impact of such long memory latencies. But most of the currently proposed data prefetchers predict future memory accesses based on current memory misses. This limits the opportunity that can be exploited to guide prefetching. In this thesis, we propose a branch-directed data prefetcher that uses the high prediction accuracies of current-generation branch predictors to predict a future basic block trace that the program will execute and issues prefetches for all the identified memory instructions contained therein. We also propose a...
Chip Multiprocessors (CMP) are an increasingly popular architecture and increasing numbers of vendor...
The “Memory Wall” [1], is the gap in performance between the processor and the main memory. Over the...
Traditional automatic test pattern generation achieves high coverage of logic faults in integrated c...
The increasing gap between processor and main memory speeds has become a serious bottleneck towards ...
Modern superscalar pipelines have tremendous capacity to consume the instruction stream. This has be...
Hardware prefetching is an effective technique for hiding cache miss latencies in modern processor d...
The “Memory Wall”, the vast gulf between processor execution speed and memory latency, has led to th...
textModern microprocessors devote a large portion of their chip area to caches in order to bridge t...
Sequential performance is still an issue in computing. While some prediction mechanisms such as bran...
Memory arrays cannot be as easily tested as other storage elements in a chip. Most of the flip-flops...
It is well known that memory latency is a major deterrent to achieving the maximum possible performa...
This research describes an approach for path generation using an observability metric for delay test...
Modern superscalar processors highly rely on the speculative execution which speculatively executes ...
This dissertation focuses on improving the accuracy and efficiency of path delay test generation usi...
General purpose processors were once designed with the major goal of maximizing performance. As powe...
Chip Multiprocessors (CMP) are an increasingly popular architecture and increasing numbers of vendor...
The “Memory Wall” [1], is the gap in performance between the processor and the main memory. Over the...
Traditional automatic test pattern generation achieves high coverage of logic faults in integrated c...
The increasing gap between processor and main memory speeds has become a serious bottleneck towards ...
Modern superscalar pipelines have tremendous capacity to consume the instruction stream. This has be...
Hardware prefetching is an effective technique for hiding cache miss latencies in modern processor d...
The “Memory Wall”, the vast gulf between processor execution speed and memory latency, has led to th...
textModern microprocessors devote a large portion of their chip area to caches in order to bridge t...
Sequential performance is still an issue in computing. While some prediction mechanisms such as bran...
Memory arrays cannot be as easily tested as other storage elements in a chip. Most of the flip-flops...
It is well known that memory latency is a major deterrent to achieving the maximum possible performa...
This research describes an approach for path generation using an observability metric for delay test...
Modern superscalar processors highly rely on the speculative execution which speculatively executes ...
This dissertation focuses on improving the accuracy and efficiency of path delay test generation usi...
General purpose processors were once designed with the major goal of maximizing performance. As powe...
Chip Multiprocessors (CMP) are an increasingly popular architecture and increasing numbers of vendor...
The “Memory Wall” [1], is the gap in performance between the processor and the main memory. Over the...
Traditional automatic test pattern generation achieves high coverage of logic faults in integrated c...