Dependable computing on unreliable substrates is the next challenge the computing community needs to overcome due to both manufacturing limitations in low geometries and the necessity to aggressively minimize power consumption. System designers often need to analyze the way hardware faults manifest as errors at the architectural level and how these errors affect application correctness. This paper introduces GemFI, a fault injection tool based on the cycle accurate full system simulator Gem5. GemFI provides fault injection methods and is easily extensible to support future fault models. It also supports multiple processor models and ISAs and allows fault injection in both functional and cycle-accurate simulations. GemFI offers fast-forwardi...
International audienceDependability is a key decision factor in today's global business environment....
Fault injection is a pivotal technique in dependability benchmarking. Unfortunately, existing genera...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
This paper presents GOOFI-2, a comprehensive fault injection tool for experimental dependability ass...
Fault injection (FI) is an experimental technique to assess the robustness of software by deliberate...
This paper presents a framework called GOOFI (Generic Object-Oriented Fault Injection) for experimen...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Smaller feature size, greater chip density, and minimal power consumption all lead to an increased n...
Abstract—Due to voltage and structure shrinking, the influence of radiation on a circuit’s operation...
Our society is faced with an increasing dependence on computing systems, not only in high tech consu...
Fault injection is a widely used approach for experiment-based dependability evaluation in which fau...
Software-implemented fault injection (SWIFI) is an established experimental technique to evaluate th...
Fault Injection (FI) is an established testing technique to assess the fault-tolerance of computer s...
Software-implemented fault injection (SWIFI) is an established experimental technique to evaluate th...
Fault Injection (FI) is an established testing technique to assess the fault-tolerance of computer s...
International audienceDependability is a key decision factor in today's global business environment....
Fault injection is a pivotal technique in dependability benchmarking. Unfortunately, existing genera...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...
This paper presents GOOFI-2, a comprehensive fault injection tool for experimental dependability ass...
Fault injection (FI) is an experimental technique to assess the robustness of software by deliberate...
This paper presents a framework called GOOFI (Generic Object-Oriented Fault Injection) for experimen...
Hardware errors are projected to increase in modern computer systems due to shrinking feature sizes ...
Smaller feature size, greater chip density, and minimal power consumption all lead to an increased n...
Abstract—Due to voltage and structure shrinking, the influence of radiation on a circuit’s operation...
Our society is faced with an increasing dependence on computing systems, not only in high tech consu...
Fault injection is a widely used approach for experiment-based dependability evaluation in which fau...
Software-implemented fault injection (SWIFI) is an established experimental technique to evaluate th...
Fault Injection (FI) is an established testing technique to assess the fault-tolerance of computer s...
Software-implemented fault injection (SWIFI) is an established experimental technique to evaluate th...
Fault Injection (FI) is an established testing technique to assess the fault-tolerance of computer s...
International audienceDependability is a key decision factor in today's global business environment....
Fault injection is a pivotal technique in dependability benchmarking. Unfortunately, existing genera...
Thesis: M. Eng., Massachusetts Institute of Technology, Department of Electrical Engineering and Com...