Smaller feature size, greater chip density, and minimal power consumption all lead to an increased number of faults in computing systems. Among these faults are soft errors. They are mainly caused by incident radiation. When a particle strikes a semiconductor and deposits enough energy along its path, charge builds up and the transistor temporarily has a different state. If this state is captured by a memory element such as a latch, the system can produce a faulty result. Due to the current technology trends ever decreasing the feature size and minimizing power consumption, reliability is becoming a serious concern in the current and future designs. More and more research is dedicated to fault tolerance of computing systems. One of the prob...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
Abstract—Due to voltage and structure shrinking, the influence of radiation on a circuit’s operation...
Smaller feature size, greater chip density, and minimal power con-sumption all lead to an increased ...
Fault injection is a widely used approach for experiment-based dependability evaluation in which fau...
Increasing chip power densities allied to the continuous technology shrink is making emerging multip...
Abstract—Fault injection is a widely used approach for experiment-based dependability evaluation. In...
International audienceOne of the consequence of the scaling down of latest technologies, is that dig...
International audienceDependability is a key decision factor in today's global business environment....
Detailed information on a system\u27s behavior in the presence of faults is often vital. It may be u...
Dependable computing on unreliable substrates is the next challenge the computing community needs to...
© 2018 IEEE. Several software-implemented fault injection tools and processes have been proposed to ...
<p>This thesis deals with techniques for designing and evaluating error detection and recovery mecha...
The adoption of Microprocessors is increasingly diversifying to several embedded and mo- bile device...
Our society is faced with an increasing dependence on computing systems, not only in high tech consu...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
Abstract—Due to voltage and structure shrinking, the influence of radiation on a circuit’s operation...
Smaller feature size, greater chip density, and minimal power con-sumption all lead to an increased ...
Fault injection is a widely used approach for experiment-based dependability evaluation in which fau...
Increasing chip power densities allied to the continuous technology shrink is making emerging multip...
Abstract—Fault injection is a widely used approach for experiment-based dependability evaluation. In...
International audienceOne of the consequence of the scaling down of latest technologies, is that dig...
International audienceDependability is a key decision factor in today's global business environment....
Detailed information on a system\u27s behavior in the presence of faults is often vital. It may be u...
Dependable computing on unreliable substrates is the next challenge the computing community needs to...
© 2018 IEEE. Several software-implemented fault injection tools and processes have been proposed to ...
<p>This thesis deals with techniques for designing and evaluating error detection and recovery mecha...
The adoption of Microprocessors is increasingly diversifying to several embedded and mo- bile device...
Our society is faced with an increasing dependence on computing systems, not only in high tech consu...
This thesis deals with the design and validation of low-cost error detecting mechanisms that can be ...
This thesis deals with the problem of validating and estimating the effectiveness of error handling ...
Abstract—Due to voltage and structure shrinking, the influence of radiation on a circuit’s operation...