Add to ORKGThin film materials are widely used as hard, protective coatings for softer surfaces. It is known that fracture strength and hardness are related to the elastic and plastic properties [1]. The elastic constants of the film deposited on a substrate are, however, difficult to measure. By a technique which was recently discussed [2] the elastic constants o
Quantitative acoustic microscopy has been used to measure the velocity of leaky surface acoustic wav...
The mechanical properties are often the main topic, but at least a necessary precondition in the app...
The elastic property of the film-substrate interface of thin-film systems is characterized with an o...
Thin film materials are widely used as hard, protective coatings for softer surfaces. It is known th...
Thin film materials are widely used as hard, protective coatings for softer surfaces. It is known th...
Measuring elastic properties of thin film on substrates is important in the analysis of residual str...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
The objectives were to determine the elastic constants of thin films deposited on substrates, to mea...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
In Atomic Force Acoustic Microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
Quantitative acoustic microscopy has been used to measure the velocity of leaky surface acoustic wav...
The mechanical properties are often the main topic, but at least a necessary precondition in the app...
The elastic property of the film-substrate interface of thin-film systems is characterized with an o...
Thin film materials are widely used as hard, protective coatings for softer surfaces. It is known th...
Thin film materials are widely used as hard, protective coatings for softer surfaces. It is known th...
Measuring elastic properties of thin film on substrates is important in the analysis of residual str...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
New techniques are continuously being developed to produce films and thin films, whose properties ty...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
The objectives were to determine the elastic constants of thin films deposited on substrates, to mea...
We used the Continuous Wave Scanning Acoustic Microscope to characterize thin film materials. The me...
In Atomic Force Acoustic Microscopy (AFAM) the cantilever is vibrating in one of its resonance frequ...
Quantitative acoustic microscopy has been used to measure the velocity of leaky surface acoustic wav...
The mechanical properties are often the main topic, but at least a necessary precondition in the app...
The elastic property of the film-substrate interface of thin-film systems is characterized with an o...