Transient faults are emerging as a critical concern in the reliability of general-purpose microprocessors. As archi-tectural trends point towards multi-threaded multi-core de-signs, there is substantial interest in adapting such parallel hardware resources for transient fault tolerance. This paper proposes a software-based multi-core alternative for tran-sient fault tolerance using process-level redundancy (PLR). PLR creates a set of redundant processes per application process and systematically compares the processes to guar-antee correct execution. Redundancy at the process level allows the operating system to freely schedule the processes across all available hardware resources. PLR’s software-centric approach to transient fault toleranc...
In this paper we propose a hybrid solution to ensure results correctness when deploying several appl...
This paper makes a case for using multi-core processors to simultaneously achieve transient-fault to...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
Transient faults are emerging as a critical concern in the reliability of general-purpose microproce...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
A new approach is proposed that exploits repetition inherent in programs to provide low-overhead tra...
International audienceDevelopment trends for computing platforms moved from increasing the frequency...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Smaller transistor sizes and reduction in voltage levels in modern microprocessors induce higher sof...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
This paper describes a single-version algorithmic approach to design in fault tolerant computing in ...
Modern safety-critical embedded applications like autonomous driving need to be fail-operational. At...
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded proc...
Future multicore processors will become more susceptible to a variety of hardware failures. In parti...
In this paper we propose a hybrid solution to ensure results correctness when deploying several appl...
This paper makes a case for using multi-core processors to simultaneously achieve transient-fault to...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
Transient faults are emerging as a critical concern in the reliability of general-purpose microproce...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
A new approach is proposed that exploits repetition inherent in programs to provide low-overhead tra...
International audienceDevelopment trends for computing platforms moved from increasing the frequency...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
Continued CMOS scaling is expected to make future micro-processors susceptible to transient faults, ...
Smaller transistor sizes and reduction in voltage levels in modern microprocessors induce higher sof...
Transient faults are emerging as a critical reliability concern for modern microproces-sors. Recentl...
This paper describes a single-version algorithmic approach to design in fault tolerant computing in ...
Modern safety-critical embedded applications like autonomous driving need to be fail-operational. At...
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded proc...
Future multicore processors will become more susceptible to a variety of hardware failures. In parti...
In this paper we propose a hybrid solution to ensure results correctness when deploying several appl...
This paper makes a case for using multi-core processors to simultaneously achieve transient-fault to...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...