A new approach is proposed that exploits repetition inherent in programs to provide low-overhead transient fault protection in a processor. Programs repeatedly execute the same instructions within close time periods. This can be viewed as a time redundant re-execution of a program, except that inputs to these inherent time redundant (ITR) instructions vary. Nevertheless, certain microarchitectural events in the processor are independent of the input and only depend on the program instructions. Such events can be recorded and confirmed when ITR instructions repeat. In this paper, we use ITR to detect transient faults in the fetch and decode units of a processor pipeline, avoiding costly approaches like structural duplication or explicit time...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceWe present a novel logic-level circuit transformation technique for the automa...
Transient faults are emerging as a critical concern in the reliability of general-purpose microproce...
Time redundant execution of tasks and comparison of results is a well-known technique for detecting ...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded proc...
CMOS scaling increases susceptibility of microprocessors to transient faults. Most current proposals...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
This paper describes a single-version algorithmic approach to design in fault tolerant computing in ...
A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to cha...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
The advances in IC process make future chip multiprocessors (CMPs) more and more vulnerable to trans...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceWe present a novel logic-level circuit transformation technique for the automa...
Transient faults are emerging as a critical concern in the reliability of general-purpose microproce...
Time redundant execution of tasks and comparison of results is a well-known technique for detecting ...
Abstract—Transient faults are emerging as a critical concern in the reliability of general-purpose m...
This paper speculates that technology trends pose new challenges for fault tolerance in microprocess...
We propose a scheme for transient-fault recovery called Simultaneously and Redundantly Threaded proc...
CMOS scaling increases susceptibility of microprocessors to transient faults. Most current proposals...
textSilicon reliability has reemerged as a very important problem in digital system design. As volta...
This paper describes a single-version algorithmic approach to design in fault tolerant computing in ...
A transient hardware fault occurs when an energetic particle strikes a transistor, causing it to cha...
As microprocessors continue to evolve and grow in function-ality, the use of smaller nanometer techn...
In this dissertation we address the overhead reduction of fault tolerance (FT) techniques. Due to te...
The advances in IC process make future chip multiprocessors (CMPs) more and more vulnerable to trans...
Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of i...
Embedded systems are increasingly deployed in harsh environments that their components were not nece...
International audienceWe present a novel logic-level circuit transformation technique for the automa...