As the scaling of Si MOSFET approaches towards its limiting value, new alternatives are coming up to overcome these limitations. In this paper first we have reviewed carbon nanotube field effect transistor (CNTFET) and types of CNTFET. We have then studied the effect of channel length and chirality on the drain current for planer CNTFET. The Id~Vd curves for planer CNTFETs having different channel lengths and diameters are plotted. For the same, Id~Vd curves for different applied gate voltages are also plotted. We have then discussed the effect of diameter on the characteristic curves for a cylindrical CNTFET. Finally a brief comparison between the performance of Si-MOSFET and CNTFET is given
Carbon nanotube (CNT) has witnessed great importance due to its electronic and mechanical properties...
This paper discusses a comprehensive analytical study of electrical properties of single‐wall conven...
As the physical gate length of current devices is reduced to below 65 nm, effects (such as large par...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Scaling process of silicon transistor, particularly MOSFET, in the past decades had increased the pe...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
In this work, we investigate the expected device per-formance and the scaling perspectives of Carbon...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Abstract: A detailed review on the Carbon Nanotube Filed Effect Transistors (CNTFETs) has been given...
Scaling down of Semiconductor Devices in nanometer range has been almost stagnated due to various ob...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Abstract-- The performance of carbon nanotube-based transistor is analyzed. The effect of geometrica...
The goal of the present work is to explore the concept of nanotechnology, carbon nanotubes and its f...
We study carbon nanotube based field-effect transistors (CNTFETs) by means of two different approach...
Carbon nanotube (CNT) has witnessed great importance due to its electronic and mechanical properties...
This paper discusses a comprehensive analytical study of electrical properties of single‐wall conven...
As the physical gate length of current devices is reduced to below 65 nm, effects (such as large par...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Scaling process of silicon transistor, particularly MOSFET, in the past decades had increased the pe...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
In this work, we investigate the expected device per-formance and the scaling perspectives of Carbon...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Abstract: A detailed review on the Carbon Nanotube Filed Effect Transistors (CNTFETs) has been given...
Scaling down of Semiconductor Devices in nanometer range has been almost stagnated due to various ob...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
Abstract-- The performance of carbon nanotube-based transistor is analyzed. The effect of geometrica...
The goal of the present work is to explore the concept of nanotechnology, carbon nanotubes and its f...
We study carbon nanotube based field-effect transistors (CNTFETs) by means of two different approach...
Carbon nanotube (CNT) has witnessed great importance due to its electronic and mechanical properties...
This paper discusses a comprehensive analytical study of electrical properties of single‐wall conven...
As the physical gate length of current devices is reduced to below 65 nm, effects (such as large par...