Scaling down of Semiconductor Devices in nanometer range has been almost stagnated due to various obstacles faced such as decrease in trans-conductance, source to drain tunneling, gate oxide current leakage, increase in propagation delay, less control over gate region, device mismatch and mobility degradation. Research is continuously in progress to implement Carbon Nanotubes (CNT) in Field Effect Transistor (FET) known as Carbon Nanotube Field Effect Transistor (CNFET). It is found that CNFET based digital circuits could enhance the performance over regular Metal Oxide Semiconductor Field Effect Transistors (MOSFETs) like better channel control, increase in current density and electron mobility, better threshold voltage and increase in tra...
In this paper, the design of SPICE circuit model has been discussed for Carbon Nanotube Field Effect...
This thesis is a study on designing, understanding and performance benchmarking of FPGA (Field Progr...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
This paper addresses at first carbon NanoTubes (CNTs) and importance of CNT over silicon based devic...
The goal of the present work is to explore the concept of nanotechnology, carbon nanotubes and its f...
Scaling process of silicon transistor, particularly MOSFET, in the past decades had increased the pe...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
This paper discusses a comprehensive analytical study of electrical properties of single‐wall conven...
Abstract: A detailed review on the Carbon Nanotube Filed Effect Transistors (CNTFETs) has been given...
The Carbon Nanotube Field Effect Transistor (CNFET) is one of the most promising candidates to becom...
As the scaling down of silicon MOSFET is approaching its utmost limit, different materials are effec...
In this paper, the design of SPICE circuit model has been discussed for Carbon Nanotube Field Effect...
As the physical gate length of current devices is reduced to below 65 nm, effects (such as large par...
In this paper, the design of SPICE circuit model has been discussed for Carbon Nanotube Field Effect...
This thesis is a study on designing, understanding and performance benchmarking of FPGA (Field Progr...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...
This paper addresses at first carbon NanoTubes (CNTs) and importance of CNT over silicon based devic...
The goal of the present work is to explore the concept of nanotechnology, carbon nanotubes and its f...
Scaling process of silicon transistor, particularly MOSFET, in the past decades had increased the pe...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
The performance of a semiconducting carbon nanotube (CNT) is assessed and tabulated for parameters a...
This paper discusses a comprehensive analytical study of electrical properties of single‐wall conven...
Abstract: A detailed review on the Carbon Nanotube Filed Effect Transistors (CNTFETs) has been given...
The Carbon Nanotube Field Effect Transistor (CNFET) is one of the most promising candidates to becom...
As the scaling down of silicon MOSFET is approaching its utmost limit, different materials are effec...
In this paper, the design of SPICE circuit model has been discussed for Carbon Nanotube Field Effect...
As the physical gate length of current devices is reduced to below 65 nm, effects (such as large par...
In this paper, the design of SPICE circuit model has been discussed for Carbon Nanotube Field Effect...
This thesis is a study on designing, understanding and performance benchmarking of FPGA (Field Progr...
Silicon based devices are getting problem with the limitation of channel length for fabrication of t...