Materials Experiment and Analysis Database: X-ray diffraction analysis in which 0 sub-analyses are performed on plate(s) containing Ti,Ni,Ar annealed at 550.0C to add O on 2017-01-12 from Analysis 20170112.155057
- Soedarmadji, Edwin
- Gregoire, John
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DOIAbstract
This record is a component of the Materials Experiment and Analysis Database (MEAD). It contains raw data and metadata from millions of materials synthesis and characterization experiments, as well as the analysis and distillation of that data into property and performance metrics. The unprecedented quantity and diversity of experimental data are searchable by experiment and analysis attributes generated by both researchers and data processing software.Files available via S3 at https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/thxs-m006/</p>20170112.155057.copied-20170112223113781PST.zip 0.04 GB <a role="button" class="ui compact mini button" href="https://renc.osn.xsede.org/ini210004tommorrell/0_gregoire/thx...