This thesis focuses primarily on the evaluation of the functional effects of errors occurring in the SRAM configuration memory of some FPGAs. Xilinx Virtex II Pro family is used as a first case study. Experiments under laser beam allowed us to have a good overview of realistic error patterns, related to real disturbance sources. A suited fault injection methodology has thus been defined to improve design-time robustness evaluations of a circuit implemented on this type of technology. This methodology is based on runtime reconfiguration. The approach has then been evaluated on several technological targets, requiring the development of several fault injection environments. The study included for the first time the ATMEL AT40K family, with a ...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This thesis is devoted to the development of Single Event Upset hardness methodologies dedicated to ...
Cette thèse s'intéresse en premier lieu à l'évaluation des effets fonctionnels des erreurs survenant...
This thesis deals primarily with the analysis of the functionaleffects of errors in the configuratio...
Cette thèse s'intéresse en premier lieu à l'analyse des effetsfonctionnels des erreurs dans laconfig...
ISBN : 978-2-84813-136-8Security of digital processing is important in our society. Many application...
ISBN : 978-2-84813-139-9This work aims at designing a test methodology to analyze the effect of natu...
ISBN 978-1-4799-1312-1International audienceProduct or design quality encompasses many aspects. One ...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
De nos jours, les circuits FPGAs à base de mémoire SRAM sont omniprésents dans les applications élec...
ISBN 978-1-4244-6965-9International audienceLaser-based fault injections are currently the most effi...
This thesis presents the study and development of fault-tolerant techniques for programmable archite...
International audienceThis paper presents the development of a set of tools and the associated metho...
ISBN : 978-2-84813-153-5Reprogrammable parts such as SRAM-based FPGAs are appreciated for space and ...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This thesis is devoted to the development of Single Event Upset hardness methodologies dedicated to ...
Cette thèse s'intéresse en premier lieu à l'évaluation des effets fonctionnels des erreurs survenant...
This thesis deals primarily with the analysis of the functionaleffects of errors in the configuratio...
Cette thèse s'intéresse en premier lieu à l'analyse des effetsfonctionnels des erreurs dans laconfig...
ISBN : 978-2-84813-136-8Security of digital processing is important in our society. Many application...
ISBN : 978-2-84813-139-9This work aims at designing a test methodology to analyze the effect of natu...
ISBN 978-1-4799-1312-1International audienceProduct or design quality encompasses many aspects. One ...
Modern SRAM-based Field Programmable Gate Ar- rays (FPGAs) are increasingly employed in safety- and ...
De nos jours, les circuits FPGAs à base de mémoire SRAM sont omniprésents dans les applications élec...
ISBN 978-1-4244-6965-9International audienceLaser-based fault injections are currently the most effi...
This thesis presents the study and development of fault-tolerant techniques for programmable archite...
International audienceThis paper presents the development of a set of tools and the associated metho...
ISBN : 978-2-84813-153-5Reprogrammable parts such as SRAM-based FPGAs are appreciated for space and ...
ISBN 2-84813-014-8Fault injection techniques have been used for a long time to evaluate the dependab...
International audienceA new method for injecting faults in the configuration bits of SRAM-based FPGA...
This thesis is devoted to the development of Single Event Upset hardness methodologies dedicated to ...