Measurement and modeling of transient effects in partially-depleted SOI MOSFETs

  • Wei, Andy, 1972-
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Publication date
January 1996
Publisher
Massachusetts Institute of Technology

Abstract

Thesis (M.S.)--Massachusetts Institute of Technology, Dept. of Electrical Engineering and Computer Science, 1996.Includes bibliographical references (leaves 75-76).by Andy Wei.M.S

Extracted data

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