Digital circuits in 6H-SiC has been implemented using enhancement mode transistors configured as non-saturated load devices[1,2]. However, due to their reduced voltage swing, degraded noise margins, and the need for large Beta ratios, their performance is far from optimal. To overcome these limitations, we propose to use depletion mode MOSFETs configured as saturated load devices which will yield a significant performance improvement. Two types of depletion mode MOSFETs are being considered: 1) buried channel and 2) surface channel. They are both fabricated by implanting nitrogen ions into an Al doped p-type SiC substrate to form a channel. The two devices only differ by their ion implantation energy and dose. The buried channel MOSFET [3]...
In this work, a lateral 4H-SiC n-LDMOS transistor, based on the principle of a reduced surface field...
Due to their high breakdown strength, power transistors made of wide bandgap semiconductors, for exa...
In this work, the impact of ion implantation into the MOSFET channel region on the channel mobility ...
This paper presents a preliminary theoretical and numerical investigation of 4H-SiC JFET and MOSFET ...
Abstract—In this paper, a new structure of Silicon Carbide (SiC) accumulation-mode MOSFET (ACCUFET) ...
This thesis describes realisation of 4H-SiC radio-frequency metal-oxide-semiconductor field effect t...
Our study involves the design, fabrication, and characterization of the basic depletion mode MOSFET ...
Silicon Carbide (SiC) devices have the potential to reduce energy losses in high power applications....
The 4H-SiC power MOSFET is an excellent candidate for power applications. Major technical difficulti...
We investigate the performance of thin-film accumulation mode (AM) SOI MOSFETs for ultrashort channe...
For solid-state power devices, there exists need for a material with a higher band gap which will re...
Abstract: Silicon Carbide (SiC) has revolutionized the semiconductor power devices. It is a wide ban...
The IGBT is a bipolar device. Structurally, it is very similar to the vertical MOSFET, except that t...
Silicon carbide is a wide bandgap semiconductor that is well suited for high power, high temperature...
Power converters utilising SiC MOSFETs have attracted significant interest from the automotive indus...
In this work, a lateral 4H-SiC n-LDMOS transistor, based on the principle of a reduced surface field...
Due to their high breakdown strength, power transistors made of wide bandgap semiconductors, for exa...
In this work, the impact of ion implantation into the MOSFET channel region on the channel mobility ...
This paper presents a preliminary theoretical and numerical investigation of 4H-SiC JFET and MOSFET ...
Abstract—In this paper, a new structure of Silicon Carbide (SiC) accumulation-mode MOSFET (ACCUFET) ...
This thesis describes realisation of 4H-SiC radio-frequency metal-oxide-semiconductor field effect t...
Our study involves the design, fabrication, and characterization of the basic depletion mode MOSFET ...
Silicon Carbide (SiC) devices have the potential to reduce energy losses in high power applications....
The 4H-SiC power MOSFET is an excellent candidate for power applications. Major technical difficulti...
We investigate the performance of thin-film accumulation mode (AM) SOI MOSFETs for ultrashort channe...
For solid-state power devices, there exists need for a material with a higher band gap which will re...
Abstract: Silicon Carbide (SiC) has revolutionized the semiconductor power devices. It is a wide ban...
The IGBT is a bipolar device. Structurally, it is very similar to the vertical MOSFET, except that t...
Silicon carbide is a wide bandgap semiconductor that is well suited for high power, high temperature...
Power converters utilising SiC MOSFETs have attracted significant interest from the automotive indus...
In this work, a lateral 4H-SiC n-LDMOS transistor, based on the principle of a reduced surface field...
Due to their high breakdown strength, power transistors made of wide bandgap semiconductors, for exa...
In this work, the impact of ion implantation into the MOSFET channel region on the channel mobility ...