We have developed a numerical diffraction tool for cases in which the incident field is a focused spot and the diffracting structure is a single structure or an aperiodic surface. Our approach uses the integral formulation to solve Maxwell’s equations and is different from previously published methods in its choice of basis function. We compared numerical results with experimental measurements of the far-field intensity for a focused spot incident on an aluminum grating, and the comparison was favorable. Finally, we predict the diffraction behavior of the proposed digital video disk format for the next generation of optical disk. Our analysis shows that the reflected signal for this format has a strong dependence on the polarization of the ...
Hertz vector diffraction theory is applied to a focused TEM00 Gaussian light field passing through a...
Cataloged from PDF version of article.Computation of the diffraction field from a given set of arbit...
We investigated two optical methods for characterizing submicron structures. Average errors of a few...
We have developed a numerical diffraction tool for cases in which the incident field is a focused sp...
The amplitude and the phase of the diffracted far field depends on polarization when the diffracting...
The primary objective of this dissertation is to present a clear physical picture and useful insight...
The reflection of a focused spot from a digital versatile disk (DVD) depends strongly on the polariz...
Modern optical technologies, such as microscopy, data storage, and lithography, require optical ligh...
We describe a rigorous model for the scattering of a three-dimensional focused spot by a one-dimensi...
A plane wave theory was developed to study electromagnetic diffraction by plane reflection diffracti...
We present a comparison among several fully-vectorial methods applied to a basic scattering problem ...
Diffractive optical elements comprising sub-wavelength aperiodic surface reliefs of finite length re...
International audienceAn analytical approximate solution of the electromagnetic field on a subwavele...
We predict that narrow beams, reflecting from flat subwavelength diffraction gratings, can focus. Th...
Abstract: "We have recently introduced a method of variation of boundaries for the solution of diffr...
Hertz vector diffraction theory is applied to a focused TEM00 Gaussian light field passing through a...
Cataloged from PDF version of article.Computation of the diffraction field from a given set of arbit...
We investigated two optical methods for characterizing submicron structures. Average errors of a few...
We have developed a numerical diffraction tool for cases in which the incident field is a focused sp...
The amplitude and the phase of the diffracted far field depends on polarization when the diffracting...
The primary objective of this dissertation is to present a clear physical picture and useful insight...
The reflection of a focused spot from a digital versatile disk (DVD) depends strongly on the polariz...
Modern optical technologies, such as microscopy, data storage, and lithography, require optical ligh...
We describe a rigorous model for the scattering of a three-dimensional focused spot by a one-dimensi...
A plane wave theory was developed to study electromagnetic diffraction by plane reflection diffracti...
We present a comparison among several fully-vectorial methods applied to a basic scattering problem ...
Diffractive optical elements comprising sub-wavelength aperiodic surface reliefs of finite length re...
International audienceAn analytical approximate solution of the electromagnetic field on a subwavele...
We predict that narrow beams, reflecting from flat subwavelength diffraction gratings, can focus. Th...
Abstract: "We have recently introduced a method of variation of boundaries for the solution of diffr...
Hertz vector diffraction theory is applied to a focused TEM00 Gaussian light field passing through a...
Cataloged from PDF version of article.Computation of the diffraction field from a given set of arbit...
We investigated two optical methods for characterizing submicron structures. Average errors of a few...