In this paper, for the first. time, we report a study on the short channel performance of Single Halo (SH) thin film Silicon-on-Insulators (SOI) nMOSFETs. for mixed signal applications. The single halo structure has a high pocket impurity concentration near the source end of the channel and a low impurity concentration in the rest of the channel. Besides having excellent dc output characteristics, better V-th - L roll-off control, lower DIBL, higher breakdown voltages and kink free-operation, these devices. show higher ac transconductance, higher output resistance and better dynamic Intrinsic gain. The experimental results have also shown that SH SOI MOSFETs exhibit lower hot carrier degradation In comparison with the conventional (CON) hom...
A study of parasitic bipolar junction transistor effects in single pocket thin film silicon-on-insul...
grantor: University of TorontoSilicon-On-Insulator (SOI) CMOS technology is a potential te...
International audienceSilicon On Insulator-based devices seem to be the best candidates for the ulti...
In this paper, we report a study on the small signal characterization and simulation of single halo ...
For the first time, we report a study on the hot carrier reliability performance of single halo (SH)...
For the first time, we report a study on the hot carrier reliability performance of single halo (SH)...
In this paper, we propose a design of a 0.1 mu m single halo (SH) thin film silicon-on-insulator (SO...
In this paper, we propose a design of a 0.1 µm single halo (SH) thin film silicon-on-insulator (SOI)...
In this paper, for the first time, we report a study on the hot carrier reliability performance of s...
An extended low temperature study of 0.13 $\mu$m Partially-Depleted Silicon-On-Insulator nMOSFETs wi...
In this paper, with the help of simulations the concepts of source/drain (S/D) impurity profile engi...
this this paper presents an performance evaluate of partially depleted soi (pdsoi) mosfet and fully ...
This work presents a systematic comparative study of the influence of various process options on the...
Single halo (SH) and double halo (DH) metal oxide semiconductor field effect transistors (MOSFETs) h...
A study of parasitic bipolar junction transistor effects in single pocket thin film silicon-on-insul...
A study of parasitic bipolar junction transistor effects in single pocket thin film silicon-on-insul...
grantor: University of TorontoSilicon-On-Insulator (SOI) CMOS technology is a potential te...
International audienceSilicon On Insulator-based devices seem to be the best candidates for the ulti...
In this paper, we report a study on the small signal characterization and simulation of single halo ...
For the first time, we report a study on the hot carrier reliability performance of single halo (SH)...
For the first time, we report a study on the hot carrier reliability performance of single halo (SH)...
In this paper, we propose a design of a 0.1 mu m single halo (SH) thin film silicon-on-insulator (SO...
In this paper, we propose a design of a 0.1 µm single halo (SH) thin film silicon-on-insulator (SOI)...
In this paper, for the first time, we report a study on the hot carrier reliability performance of s...
An extended low temperature study of 0.13 $\mu$m Partially-Depleted Silicon-On-Insulator nMOSFETs wi...
In this paper, with the help of simulations the concepts of source/drain (S/D) impurity profile engi...
this this paper presents an performance evaluate of partially depleted soi (pdsoi) mosfet and fully ...
This work presents a systematic comparative study of the influence of various process options on the...
Single halo (SH) and double halo (DH) metal oxide semiconductor field effect transistors (MOSFETs) h...
A study of parasitic bipolar junction transistor effects in single pocket thin film silicon-on-insul...
A study of parasitic bipolar junction transistor effects in single pocket thin film silicon-on-insul...
grantor: University of TorontoSilicon-On-Insulator (SOI) CMOS technology is a potential te...
International audienceSilicon On Insulator-based devices seem to be the best candidates for the ulti...