A novel sensing algorithm for non-volatile Spin-Transfer Torque Magneto-resistive Random Access Memory (STT-MRAM) is presented. The dynamic reference sense amplifier (DRSA) improves sensing margin to achieve high reliability and sensitivity by increasing the difference of input voltages of sense amplifier. A dynamic reference sensing algorithm is proposed as a solution for the read margin loss due to variation in magnetic tunneling junction (MTJ) parameters of the STT-MRAM. The proposed sensing method was designed in standard 0.18 um process parameters, and simulation results indicate simultaneously increased the read margin compared with the conventional sensing method.This work was supported by the IT R&D program of MKE/KEIT. [KI00218...
Magnetoresistive memory (MRAM) technology which successfully combines integrated circuit and magneti...
Spin-transfer torque magnetic random access memories (STT-MRAMs) based on magnetic tunnel junction (...
Abstract—With the continuing scaling of MTJ, the high-speed reading of STT-RAM becomes increasingly ...
We proposed a novel self-reference sense amplifier scheme for spin-transfer-torque magneto-resistanc...
In this work, we investigated the sensing challenges of spin-transfer torque MRAMs structured with p...
Spin-Transfer Torque Random Access Memory (STT-MRAM) has been explored as a post-CMOS technology for...
A high-sensitivity switched-current sensing circuit for reading data non-destructively from 1T-1MTJ ...
In this paper, we present two integrated circuits for sensing data nondestructively from one-transis...
A new reference signal generation method for high-density MRAM is reported. 0.4 x 0.8 mum(2) magneti...
This thesis presents three research contributions in the areas of modelling, circuit-level design, a...
International audienceSpin transfer torque magnetic random access memory (STT-MRAM) possesses many d...
In recent years, we have been witnessing the rise of spin-transfer torque random access memory (STT-...
A current–mode binary–search sensing scheme for a 4–state one– transistor one–magnetic tunnel juncti...
With scaling of CMOS and Magnetic Tunnel Junction (MTJ) devices, conventional low-current reading te...
This thesis presents the modeling and design of memory cells for Spin Torque Transfer Magnetoresisti...
Magnetoresistive memory (MRAM) technology which successfully combines integrated circuit and magneti...
Spin-transfer torque magnetic random access memories (STT-MRAMs) based on magnetic tunnel junction (...
Abstract—With the continuing scaling of MTJ, the high-speed reading of STT-RAM becomes increasingly ...
We proposed a novel self-reference sense amplifier scheme for spin-transfer-torque magneto-resistanc...
In this work, we investigated the sensing challenges of spin-transfer torque MRAMs structured with p...
Spin-Transfer Torque Random Access Memory (STT-MRAM) has been explored as a post-CMOS technology for...
A high-sensitivity switched-current sensing circuit for reading data non-destructively from 1T-1MTJ ...
In this paper, we present two integrated circuits for sensing data nondestructively from one-transis...
A new reference signal generation method for high-density MRAM is reported. 0.4 x 0.8 mum(2) magneti...
This thesis presents three research contributions in the areas of modelling, circuit-level design, a...
International audienceSpin transfer torque magnetic random access memory (STT-MRAM) possesses many d...
In recent years, we have been witnessing the rise of spin-transfer torque random access memory (STT-...
A current–mode binary–search sensing scheme for a 4–state one– transistor one–magnetic tunnel juncti...
With scaling of CMOS and Magnetic Tunnel Junction (MTJ) devices, conventional low-current reading te...
This thesis presents the modeling and design of memory cells for Spin Torque Transfer Magnetoresisti...
Magnetoresistive memory (MRAM) technology which successfully combines integrated circuit and magneti...
Spin-transfer torque magnetic random access memories (STT-MRAMs) based on magnetic tunnel junction (...
Abstract—With the continuing scaling of MTJ, the high-speed reading of STT-RAM becomes increasingly ...