International audienceThe impact of nonstationary transport and quantum effects on performances of 0.1 $\mu$m partially depleted silicon-on-insulator (SOI) technology is investigated by 2D simulation on realistic devices. We analyze quantitatively the technology influence on the needed level for carrier transport modeling and we show which recipes must be used to evaluate performance of current devices. The original point is the investigation of technological parameters impact on injection velocity at source side and on drain current. We conclude that specific engineering of access region must be envisaged for taking full advantage of nonstationary effects on device performance
this this paper presents an performance evaluate of partially depleted soi (pdsoi) mosfet and fully ...
none4In this work we investigate the performance of fully-depleted silicon-on-insulator (SOI) and do...
This manuscript presents a theoretical and experimental study carried out on advanced technology the...
2nd European Workshop on Ultimate Integration of Silicon (ULIS 2001), GRENOBLE, FRANCE, JAN 18-19, 2...
Received 01-11-2012, online 06-11-2012 Effects of carrier energy quantization in semiconductor surfa...
As critical transistor dimensions scale below the 100 nm (nanoscale) regime, quantum mechanical effe...
In this work recently developed 2D Multi-Subband Monte Carlo device simulator and a Non-Equilibrium ...
International audienceA thorough investigation of unphysical phenomena occurring in hydrodynamic sim...
Invention of transistor is the foundation of electronics industry. Metal Oxide Semiconductor Field E...
An accurate submicrometer MOSFET device model for Silicon-On-Insulator (SOI) technology suitable for...
Silicon-On-Insulator (SOI) is emerging as a strong technology candidate for low-power high–performan...
With the continuous scaling of CMOS technologies, Silicon-on-Insulator (SOI) technologies have becom...
International audienceGeneration-type drain current transients in advanced (down to 50 nm gate lengt...
textPartially Depleted Silicon-On-Insulator (SOI) technology has garnered more attention with regar...
In this paper, surface potential sensitivity to channel length scaling for Fully Depleted Double Gat...
this this paper presents an performance evaluate of partially depleted soi (pdsoi) mosfet and fully ...
none4In this work we investigate the performance of fully-depleted silicon-on-insulator (SOI) and do...
This manuscript presents a theoretical and experimental study carried out on advanced technology the...
2nd European Workshop on Ultimate Integration of Silicon (ULIS 2001), GRENOBLE, FRANCE, JAN 18-19, 2...
Received 01-11-2012, online 06-11-2012 Effects of carrier energy quantization in semiconductor surfa...
As critical transistor dimensions scale below the 100 nm (nanoscale) regime, quantum mechanical effe...
In this work recently developed 2D Multi-Subband Monte Carlo device simulator and a Non-Equilibrium ...
International audienceA thorough investigation of unphysical phenomena occurring in hydrodynamic sim...
Invention of transistor is the foundation of electronics industry. Metal Oxide Semiconductor Field E...
An accurate submicrometer MOSFET device model for Silicon-On-Insulator (SOI) technology suitable for...
Silicon-On-Insulator (SOI) is emerging as a strong technology candidate for low-power high–performan...
With the continuous scaling of CMOS technologies, Silicon-on-Insulator (SOI) technologies have becom...
International audienceGeneration-type drain current transients in advanced (down to 50 nm gate lengt...
textPartially Depleted Silicon-On-Insulator (SOI) technology has garnered more attention with regar...
In this paper, surface potential sensitivity to channel length scaling for Fully Depleted Double Gat...
this this paper presents an performance evaluate of partially depleted soi (pdsoi) mosfet and fully ...
none4In this work we investigate the performance of fully-depleted silicon-on-insulator (SOI) and do...
This manuscript presents a theoretical and experimental study carried out on advanced technology the...