go X a

ed f ne 1 min atte floa ot h cat small-angle X-ray scattering (GISAXS) technique using In this letter, X-ray reflectivity, GISAXS and powder of a diffractometer (D8 Discover, Bruker AXS) with Cu source Applied Surface Science 253 (synchrotron source and two-dimensional (2D) detector (sealed tube) followed by Göbel mirror to select and enhance Cu Ka radiation (l0 = 1.54 Å). The diffractometer has 2-circle goniometer [u(v) 2u] with 1/4-circle Eulerian cradle as sample stage. The latter has two-circlular (x and f) and three-E-mail address: satyajit.hazra@saha.ac.in. 0169-4332/ $ – see front matter # 2006 Elsevier B.V. All rights reserved. doi:10.1016/j.apsusc.2006.04.017reflectivity and diffuse scattering have been extensively used for last few years mainly for stratified systems. However, for composite thin films and multilayer, where clusters of nanometer size are dispersed in a matrix, known as nanocomposite, it is essential to know the size and shape of the clusters and their distribution or arrangement in the matrix; as the properties [8–13] strongly related to its morphology. Morphological determination of such composite films has been recently started through newly developed grazing incidence structure and morphology of a composite thin film, such as Au– LiNbO3 multilayers prepared by sequential sputtering of Au and LiNbO3 targets on float glass substrate. Optical property was then compared with such morphology. 2. Experiment X-ray scattering measurements were carried out using a versatile X-ray diffractometer (VXRD) set-up. VXRD consistsgrowth (z) direction and diffuse scattering measurements provide us large in-plane correlated features. Both speculardiffraction measurements using laboratory source X-ray scattering set-up have been combined to bring out the completethe electron density profile (EDP) of the thin films along thenanocrystals and nanoparticles 1