Dispersive readout of a silicon quantum dot with an accumulation-mode gate sensor

Sensitive charge detection has enabled qubit readout in solid-state systems. Recently, an alternative to the well-established charge detection via on-chip electrometers has emerged, based on $\textit{in situ}$ gate detectors and radio-frequency dispersive readout techniques. This approach promises to facilitate scalability by removing the need for additional device components devoted to sensing. Here, we perform gate-based dispersive readout of an accumulation-mode silicon quantum dot. We observe that the response of an accumulation-mode gate detector is significantly affected by its bias voltage, particularly if this exceeds the threshold for electron accumulation. We discuss and explain these results in light of the competing capacitive contributions to the dispersive response.This project has received funding from the European Union’s Horizon 2020 research and innovation programme under Grant Agreement No. 688539 and under the Marie Skłodowska-Curie Grant Agreement No. 654712 (SINHOPSI). This work was also financially supported by the Australian National Fabrication Facility for device fabrication. A.S.D. acknowledges support from the Australian Research Council (DP160104923 and CE11E0001017), the U.S. Army Research Office (W911NF-13-1-0024), and the Commonwealth Bank of Australia