Mixed-mode simulations of a class A amplifier is used to study the DC/RF dispersion commonly observed in AlGaN/GaN based HEMTs. We show that the observed knee walkout at frequencies greater than the emission rates of buffer traps (time constants tae > 1 week) is related to the steady state trap density and spatial location due to the DC operational bias. An increase in the drain bias point and an initial distortion of the RF signal, that is expected to disappear as the device global temperature reduces, is observed when a self-heating model is included. Finally, we propose that a reduction in the DC/RF dispersion is possible with a suitable location and concentration of an acceptor doping in the buffer
The aim of this work is to quantitatively investigate the physical origin of the temperature-depende...
This paper reports on the temperature dependent threshold voltage analysis of AlGaN/GaN High electro...
A simple experimental technique aimed at the spatial localization of the dominant trap states involv...
This paper presents a systematic analysis of the two kinds of traps encountered in AlGaN/GaN HEMTs. ...
Thanks to high-current densities and cutoff frequencies, short-channel length AlGaN/GaN HEMTs are a ...
In this paper we separately investigate the role of electric field and device self-heating (SHE) in ...
PAPER Trapping phenomena in AlGaN and InAlN barrier HEMTs with different geometries S Martin-Horca...
A novel nonlinear model for MESFET/HEMT devices is presented. The model can be applied to low power ...
We have investigated the self-heating effect on DC and RF performances of identically fabricated AlG...
[EN]The zero-bias microwave detection capability of self-switching diodes (SSDs) based on AlGaN/GaN ...
A new parametric and cost-effective technique is developed to decouple the mechanisms behind current...
GaN-based high electron mobility transistors (HEMTs) are promising candidates for future microwave e...
International audienceReliability in GaN based devices still motivates numerous studies because the ...
The ever increasing demand for high power levels at higher frequencies from the industry has stimula...
We present an analytical model for the I-V characteristics of AlGaN/GaN and AlInN/GaN high electron ...
The aim of this work is to quantitatively investigate the physical origin of the temperature-depende...
This paper reports on the temperature dependent threshold voltage analysis of AlGaN/GaN High electro...
A simple experimental technique aimed at the spatial localization of the dominant trap states involv...
This paper presents a systematic analysis of the two kinds of traps encountered in AlGaN/GaN HEMTs. ...
Thanks to high-current densities and cutoff frequencies, short-channel length AlGaN/GaN HEMTs are a ...
In this paper we separately investigate the role of electric field and device self-heating (SHE) in ...
PAPER Trapping phenomena in AlGaN and InAlN barrier HEMTs with different geometries S Martin-Horca...
A novel nonlinear model for MESFET/HEMT devices is presented. The model can be applied to low power ...
We have investigated the self-heating effect on DC and RF performances of identically fabricated AlG...
[EN]The zero-bias microwave detection capability of self-switching diodes (SSDs) based on AlGaN/GaN ...
A new parametric and cost-effective technique is developed to decouple the mechanisms behind current...
GaN-based high electron mobility transistors (HEMTs) are promising candidates for future microwave e...
International audienceReliability in GaN based devices still motivates numerous studies because the ...
The ever increasing demand for high power levels at higher frequencies from the industry has stimula...
We present an analytical model for the I-V characteristics of AlGaN/GaN and AlInN/GaN high electron ...
The aim of this work is to quantitatively investigate the physical origin of the temperature-depende...
This paper reports on the temperature dependent threshold voltage analysis of AlGaN/GaN High electro...
A simple experimental technique aimed at the spatial localization of the dominant trap states involv...