Analysis of GaN HEMTs Switching Transients Using Compact Model

The methodology to model GaN power HEMT switching transients at the circuit level is presented in this paper. A compact model to predict devices’ pulse switching characteristics and current collapse reliability issue has been developed. Parasitic RC subcircuits and a standard double-pulse switching tester to model intrinsic parasitic effects and to analyze power dissipation of GaN power HEMT are proposed and presented. Switching transient including gate-lag and drain-lag is predicted for ideal (without trap) and nonideal (with trap) devices. The results are validated by and compared to 2-D finite-element TCAD simulations. The developed methodology and compact model can successfully predict the dynamic behaviour of single and multiple power GaN HEMTs used for power electronics design