Local adhesion hysteresis (AH) is difficult to measure using an AFM due to complications introduced by compliant cantilevers as they snap-in and snap-out to/from a sample surface. But, at ultrasonic frequencies well above the cantilever mechanical resonance, the effective stiffness can increase enormously. Therefore, ultrasonically vibrating a sample in contact with an AFM tip can probe the hysteretic cycle of tip-sample in- and out-interactions [Jpn. J. Appl. Phys. 32 (1993) 22; Acoust. Imag. (1996)] allowing AH to be investigated by measuring ultrasonic hysteresis (UH). For the first time UH is compared here with lateral force microscopy (LFM) data. The same kind of experiments is also implemented for a nanoindenter based setup. Thus, the...
This work reports the development of a new method for measuring tribological properties at the nanos...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at i...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
We have modified and Atomic Force Microscope (AFM) that allow the detection of cantilever bending as...
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
Ultrasonic force microscopy (UFM) was introduced to probe nanoscale mechanical properties of stiff m...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
This chapter describes an approach that depends on the nonlinear nature of the interaction between t...
Ultrasonic vibration can be nonlinearly detected by means of an atomic force microscopy cantilever w...
We studied friction and stick-slip phenomena on bare and lubricated silicon samples by measuring the...
Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The p...
This work reports the development of a new method for measuring tribological properties at the nanos...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at i...
The increasing production of nano-devices and nano-composite materials has prompted the development ...
We have modified and Atomic Force Microscope (AFM) that allow the detection of cantilever bending as...
Use of high frequency (HF) vibrations at MHz frequencies in Atomic Force Microscopy (AFM) advanced n...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
The combination of ultrasound with atomic force microscopy (AFM) opens the high lateral resolution o...
Ultrasonic force microscopy (UFM) was introduced to probe nanoscale mechanical properties of stiff m...
The ultrasonic friction mode of an atomic force microscope is a scanning probe technique allowing on...
Dynamic Atomic Force Microscopy (AFM) modes, where the cantilever is vibrated while the sample surfa...
This chapter describes an approach that depends on the nonlinear nature of the interaction between t...
Ultrasonic vibration can be nonlinearly detected by means of an atomic force microscopy cantilever w...
We studied friction and stick-slip phenomena on bare and lubricated silicon samples by measuring the...
Recent advances in mechanical diode-based ultrasonic force microscopy techniques are reviewed. The p...
This work reports the development of a new method for measuring tribological properties at the nanos...
In Atomic Force Microscopy the deflection and torsion of micro-fabricated elastic beams with a senso...
In Atomic Force Microscopy (AFM) deflection of a microfabricated elastic beam with a sensor tip at i...