Double axis X-ray diffraction has been in use since 1920. Recently the layer structures of optoelectronic devices have been characterised to control the optical properties, for the purpose of optical communication. By the advent of modern fast computers it is now possible to simulate experimental data. Here various techniques used for calculating double axis x-ray rocking curves are described. Mismatch, tilt, and composition of layers, can be quickly deduced by simulation. This approach has been widely used in the electronics industry. Recently it has been observed that a peak shift in the active layer of a double heterostructure could lead to a miscalculation of mismatch. An investigation in this direction was made to check this effect in ...
This thesis describes the examination and characterisation of semiconductor silicon by the various m...
Multilayer mirrors find numerous X-ray applications in synchrotron and X-rays free electron lasers. ...
The theory for the Bragg dynamical X-ray diffraction and the yield of the secondary radiation scatte...
Double crystal x-ray diffractometry is a well established method for the measurement of the lattice ...
An introduction to the dynamical diffraction theory is given and its results are discussed in relati...
A windows-based simulation program using Borland C++, named Dynamical Simulation of X-ray Rocking Cu...
In the design of heteroepitaxial systems the knowledge of composition, strain and thickness of the v...
The study of materials by diffraction methods started about 100 years ago with the pioneering experi...
The study of materials by diffraction methods started about 100 years ago with the pioneering experi...
Optoelectronic devices find extensive use in optical fibre communication systems as infrared sources...
A simple x‐ray diffraction method for determining layer composition and mismatch is by measurement o...
Résumé- On a effectué une simulation mathématique des systèmes d'optique des rayons X à cristau...
We present detailed analyses of x-ray double-crystal rocking curve measurements of superlattices. Th...
Large errors may occur in the X-ray diffraction determination of epitaxial layer mismatch, thickness...
Multilayer mirrors find numerous X-ray applications in synchrotron and X-rays free electron lasers. ...
This thesis describes the examination and characterisation of semiconductor silicon by the various m...
Multilayer mirrors find numerous X-ray applications in synchrotron and X-rays free electron lasers. ...
The theory for the Bragg dynamical X-ray diffraction and the yield of the secondary radiation scatte...
Double crystal x-ray diffractometry is a well established method for the measurement of the lattice ...
An introduction to the dynamical diffraction theory is given and its results are discussed in relati...
A windows-based simulation program using Borland C++, named Dynamical Simulation of X-ray Rocking Cu...
In the design of heteroepitaxial systems the knowledge of composition, strain and thickness of the v...
The study of materials by diffraction methods started about 100 years ago with the pioneering experi...
The study of materials by diffraction methods started about 100 years ago with the pioneering experi...
Optoelectronic devices find extensive use in optical fibre communication systems as infrared sources...
A simple x‐ray diffraction method for determining layer composition and mismatch is by measurement o...
Résumé- On a effectué une simulation mathématique des systèmes d'optique des rayons X à cristau...
We present detailed analyses of x-ray double-crystal rocking curve measurements of superlattices. Th...
Large errors may occur in the X-ray diffraction determination of epitaxial layer mismatch, thickness...
Multilayer mirrors find numerous X-ray applications in synchrotron and X-rays free electron lasers. ...
This thesis describes the examination and characterisation of semiconductor silicon by the various m...
Multilayer mirrors find numerous X-ray applications in synchrotron and X-rays free electron lasers. ...
The theory for the Bragg dynamical X-ray diffraction and the yield of the secondary radiation scatte...