Heavy Ion Test Report for the AD9364 RF Transceiver

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Buchner, Stephen P.
Violette, Daniel P.
Pellish, Jonathan A.
Chen, Dakai
Berg, Melanie D.
Gigliuto, Robert A.
Casey, Megan C.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Ladbury, Raymond L.
Boutte, Alvin J.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
LaBel, Kenneth A.
Wilcox, Edward P.

July 2014

We present results and analysis investigating the effects of radiation on a variety of candidate spa...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Radiation Testing Electronics with Heavy Ions-The Best Way to Hit a Target Moving Ever Exponentially Faster

Ladbury, Ray

April 2018

In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avi...

Heavy Ion Test Report for the LTC6268-10 Operational Amplifier

Phan, Anthony M.
Feng, Steven H.
Chen, Dakai

September 2017

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibil...

Single Event Effects Testing of a Commercial-Off-The-Shelf Analog-to-Digital Converter in a Camera Application

Doty, John P.
Wilcox, Edward P.
Thayer, Carolyn
Campola, Michael J.

July 2016

Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...

Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics

Budroweit, Jan
Jaksch, Mattis
García, Ruben
Coronetti, Andrea
Kölpin, Alexander

February 2020

Nowadays, technologies have a massive impact on the design of avionic systems, even for the conserva...

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

O'Bryan, Martha V.
Howard, James W., Jr.
LaBel, Kenneth A.
Ladbury, Ray L.
Oldham, Timothy R.
Titus, Jeffrey L.
Sanders, Anthony
Buchner, Stephen P.
Poivey, Christian
Berg, Melanie

July 2007

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Current Single Event Effect Test Results for Candidate Spacecraft Electronics

Kenneth A Label
Amy K Moran
Donald K Hawkins
Anthony B Sanders
Christina M Seidleck
Hak S Kim
James E Forney
Jackson
Tull E G Stassinopoulos
Paul Marshall
James Kinnison
Bliss Carkhuff

January 1997

Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Casey, Megan C.
Berg, Melanie D.
Lauenstein, Jean-Marie
Chen, Dakai
Pellish, Jonathan A.
Wilcox, Edward P.
Campola, Michael J.
Guertin, Steven M.
LaBel, Kenneth A.
Wyrwas, Edward J.
O'Bryan, Martha V.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Berg, Melanie D.
Campola, Michael J.
LaBel, Kenneth A.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Pellish, Jonathan A.
Casey, Megan C.
Chen, Dakai
O'Bryan, Martha V.

July 2015

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFET

Campola, M. A.
Casey, M. C.
Topper, A. D.
Lauenstein, J.-M.
Wilcox, E. P.
Ladbury, R. L.
Phan, A. M.

April 2017

This study was being undertaken to determine the single event effect susceptibility of the commercia...

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Buchner, Stephen P.
Violette, Daniel P.
Pellish, Jonathan A.
Chen, Dakai
Berg, Melanie D.
Gigliuto, Robert A.
Casey, Megan C.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Ladbury, Raymond L.
Boutte, Alvin J.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
LaBel, Kenneth A.
Wilcox, Edward P.

July 2014

We present results and analysis investigating the effects of radiation on a variety of candidate spa...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Radiation Testing Electronics with Heavy Ions-The Best Way to Hit a Target Moving Ever Exponentially Faster

Ladbury, Ray

April 2018

In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avi...

Heavy Ion Test Report for the LTC6268-10 Operational Amplifier

Phan, Anthony M.
Feng, Steven H.
Chen, Dakai

September 2017

The purpose of this test is to determine the heavy ion-induced single-event effect (SEE) susceptibil...

Single Event Effects Testing of a Commercial-Off-The-Shelf Analog-to-Digital Converter in a Camera Application

Doty, John P.
Wilcox, Edward P.
Thayer, Carolyn
Campola, Michael J.

July 2016

Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...

Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics

Budroweit, Jan
Jaksch, Mattis
García, Ruben
Coronetti, Andrea
Kölpin, Alexander

February 2020

Nowadays, technologies have a massive impact on the design of avionic systems, even for the conserva...

Compendium of Current Single Event Effects Results for Candidate Spacecraft Electronics for NASA

O'Bryan, Martha V.
Howard, James W., Jr.
LaBel, Kenneth A.
Ladbury, Ray L.
Oldham, Timothy R.
Titus, Jeffrey L.
Sanders, Anthony
Buchner, Stephen P.
Poivey, Christian
Berg, Melanie

July 2007

Sensitivity of a variety of candidate spacecraft electronics to proton and heavy ion induced single ...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Current Single Event Effect Test Results for Candidate Spacecraft Electronics

Kenneth A Label
Amy K Moran
Donald K Hawkins
Anthony B Sanders
Christina M Seidleck
Hak S Kim
James E Forney
Jackson
Tull E G Stassinopoulos
Paul Marshall
James Kinnison
Bliss Carkhuff

January 1997

Abstract We present both proton and heavy ion single event effect (SEE) ground test results for cand...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Casey, Megan C.
Berg, Melanie D.
Lauenstein, Jean-Marie
Chen, Dakai
Pellish, Jonathan A.
Wilcox, Edward P.
Campola, Michael J.
Guertin, Steven M.
LaBel, Kenneth A.
Wyrwas, Edward J.
O'Bryan, Martha V.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Current Single Event Effects for Candidate Spacecraft Electronics for NASA

Berg, Melanie D.
Campola, Michael J.
LaBel, Kenneth A.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Pellish, Jonathan A.
Casey, Megan C.
Chen, Dakai
O'Bryan, Martha V.

July 2015

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Single-Event Effect Response of a Commercial ReRAM

Wilcox, Edward
Kim, Hak
Roche, Nicolas
Label, Kenneth A.
Phan, Anthony
Khachatrian, Ani
Buchner, Stephen
Chen, Dakai

May 2014

We show heavy ion test results of a commercial production-level ReRAM. The memory array is robust to...

Single-Event Effect Testing of the Vishay Si7414DN n-Type TrenchFET(Registered Trademark) Power MOSFET

Campola, M. A.
Casey, M. C.
Topper, A. D.
Lauenstein, J.-M.
Wilcox, E. P.
Ladbury, R. L.
Phan, A. M.

April 2017

This study was being undertaken to determine the single event effect susceptibility of the commercia...

Compendium of Single Event Effects, Total Ionizing Dose, and Displacement Damage for Candidate Spacecraft Electronics for NASA

Buchner, Stephen P.
Violette, Daniel P.
Pellish, Jonathan A.
Chen, Dakai
Berg, Melanie D.
Gigliuto, Robert A.
Casey, Megan C.
Lauenstein, Jean-Marie
O'Bryan, Martha V.
Ladbury, Raymond L.
Boutte, Alvin J.
Topper, Alyson D.
Cochran, Donna J.
Campola, Michael J.
LaBel, Kenneth A.
Wilcox, Edward P.

July 2014

We present results and analysis investigating the effects of radiation on a variety of candidate spa...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Radiation Testing Electronics with Heavy Ions-The Best Way to Hit a Target Moving Ever Exponentially Faster

Ladbury, Ray

April 2018

In 1972, when engineers at Hughes Aircraft Corporation discovered that errors in their satellite avi...

Heavy Ion Test Report for the AD9364 RF Transceiver

Abstract

Extracted data

Heavy Ion Test Report for the AD9364 RF Transceiver

Abstract

Extracted data

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