Incidents and Accidents: The Way of the Single Event Tester

External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Label, Kenneth A.

March 2017

In this presentation we will provide basic radiation effects on electronics, information on radiatio...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Standardizing Microprocessor and GPU Radiation Test Approaches

Wyrwas, Edward J.

July 2019

Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.
Berg, Melanie D.

March 2015

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Expecting the Unexpected: Radiation Hardened Software

Mehlitz, Peter C.
Penix, John

Radiation induced Single Event Effects (SEEs) are a serious problem for spacecraft flight software, ...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Single Event Effects (SEE) Testing: Practical Approach to Test Plans

Pellish, Jonathan Allen
Berg, Melanie D.
LaBel, Kenneth A.

March 2014

While standards and guidelines for performing SEE testing have existed for several decades, guidance...

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

LaBel, Kenneth A.
Berg, Melanie D.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Casey, Megan C.
Berg, Melanie D.
Lauenstein, Jean-Marie
Chen, Dakai
Pellish, Jonathan A.
Wilcox, Edward P.
Campola, Michael J.
Guertin, Steven M.
LaBel, Kenneth A.
Wyrwas, Edward J.
O'Bryan, Martha V.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal

Berg, Melanie D.
Label, Kenneth A.

August 2016

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Single Event Effects Testing of a Commercial-Off-The-Shelf Analog-to-Digital Converter in a Camera Application

Doty, John P.
Wilcox, Edward P.
Thayer, Carolyn
Campola, Michael J.

July 2016

Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...

Modeling and experimental verification of single event upsets

Attia, J. O.
Fogarty, T. N.
Tang, T. S.
Lindner, J. S.
Kumar, A. A.

December 1993

The research performed and the results obtained at the Laboratory for Radiation Studies, Prairie Vie...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Label, Kenneth A.

March 2017

In this presentation we will provide basic radiation effects on electronics, information on radiatio...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Standardizing Microprocessor and GPU Radiation Test Approaches

Wyrwas, Edward J.

July 2019

Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...

Complex Parts, Complex Data: Why You Need to Understand What Radiation Single Event Testing Data Does and Doesn't Show and the Implications Thereof

LaBel, Kenneth A.
Berg, Melanie D.

March 2015

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

Expecting the Unexpected: Radiation Hardened Software

Mehlitz, Peter C.
Penix, John

Radiation induced Single Event Effects (SEEs) are a serious problem for spacecraft flight software, ...

NASA Electronic Parts and Packaging Field Programmable Gate Array Single Event Effects Test Guideline Update

Berg, Melanie D.
LaBel, Kenneth A.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Single Event Effects (SEE) Testing: Practical Approach to Test Plans

Pellish, Jonathan Allen
Berg, Melanie D.
LaBel, Kenneth A.

March 2014

While standards and guidelines for performing SEE testing have existed for several decades, guidance...

NASA Electronic Parts and Packaging (NEPP) Field Programmable Gate Array (FPGA) Single Event Effects (SEE) Test Guideline Update

LaBel, Kenneth A.
Berg, Melanie D.

March 2018

The following are updated or new subjects added to the FPGA SEE Test Guidelines manual: academic ver...

Compendium of Current Single Event Effects Results from NASA Goddard Space Flight Center and NASA Electronic Parts and Packaging Program

Casey, Megan C.
Berg, Melanie D.
Lauenstein, Jean-Marie
Chen, Dakai
Pellish, Jonathan A.
Wilcox, Edward P.
Campola, Michael J.
Guertin, Steven M.
LaBel, Kenneth A.
Wyrwas, Edward J.
O'Bryan, Martha V.

July 2017

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Compendium of Single Event Effect Results from NASA Goddard Space Flight Center

Berg, Melanie D.
Wilcox, Edward P.
Lauenstein, Jean Marie
Chen, Dakai
LaBel, Kenneth A.
Casey, Megan C.
Ikpe, Stanley A.
O'Bryan, Martha V.
Pellish, Jonathan A.
Szabo, Carl M.
Campola, Michael J,

July 2016

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Field Programmable Gate Aray (FPGA) Radiation Data: All Data is Not Equal

Berg, Melanie D.
Label, Kenneth A.

August 2016

Electronic parts (integrated circuits) have grown in complexity such that determining all failure mo...

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Pellish, Jonathan A.
Wyrwas, Edward J.
Szabo, Carl M.
Chen, Dakai
Campola, Michael J.
Topper, Alyson D.
Wilcox, Edward P.
Casey, Megan C.
LaBel, Kenneth A.
Berg, Melanie D.
Lewellen, John W.
Lauenstein, Jean-Marie
Holloway, Michael A.
O'Bryan, Martha V.

July 2018

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Single Event Effects Testing of a Commercial-Off-The-Shelf Analog-to-Digital Converter in a Camera Application

Doty, John P.
Wilcox, Edward P.
Thayer, Carolyn
Campola, Michael J.

July 2016

Single event effect data is presented on the Analog Devices AD7984. The recent heavy-ion test result...

Modeling and experimental verification of single event upsets

Attia, J. O.
Fogarty, T. N.
Tang, T. S.
Lindner, J. S.
Kumar, A. A.

December 1993

The research performed and the results obtained at the Laboratory for Radiation Studies, Prairie Vie...

Compendium of Single Event Effects for Candidate Spacecraft Electronics for NASA

Kim, Hak S.
Phan, Anthony M.
Oldham, Timothy R.
O'Bryan, Martha V.
Musil, Paul L.
Chen, Dakai
Lauenstein, Jean-Marie
Casey, Megan C.
Gigliuto, Robert A.
Marshall, Cheryl
LaBel, Kenneth A.
Overend, Greg A.
Berg, Melanie
Ladbury, Raymond L.
Sanders, Anthony B.
Butte, Alvin J.
Marshall, Paul
Wilcox, Ted
Pellish, Jonathan A.

July 2012

We present the results of single events effects (SEE) testing and analysis investigating the effects...

External Radiation Test Facilities for Testing of Electronics: NASA Overview with Emphasis on Single Event Effects (SEE)

Label, Kenneth A.

March 2017

In this presentation we will provide basic radiation effects on electronics, information on radiatio...

Recent Single Event Effects Compendium of Candidate Electronics for NASA Space Systems

Heidel, David F.
Alexander, Don
Xapsos, Michael A.
Pellish, Jonathan A.
Sanders, Anthony B.
Ladbury, Raymond L.
Lauenstein, Jean-Marie
Phan, Anthony M.
Rodbell, Kenneth P.
Chen, Dakai
Swonger, Jim W.
O'Bryan, Martha V.
Oldham, Timothy R.
Campola, Michael J.
LaBel, Kenneth A.
Marshall, Cheryl J.
Marshall, Paul W.
Gauthier, Brian
Gauthier, Michael
Kim, Hak S.
Berg, Melanie D.

July 2011

We present the results of single event effects (SEE) testing and analysis investigating the effects ...

Standardizing Microprocessor and GPU Radiation Test Approaches

Wyrwas, Edward J.

July 2019

Microprocessor, Graphics Processing Units (GPUs) and DDRx memory devices have emerged as promising n...

Incidents and Accidents: The Way of the Single Event Tester

Abstract

Extracted data

Incidents and Accidents: The Way of the Single Event Tester

Abstract

Extracted data

Related items

Related items