Efficient handling of faults during operation is highly dependent on the interval (latency) from the time embedded monitoring instruments detect faults to the time when the fault manager localizes the faults. In this article, we propose a self-reconfiguring IEEE 1687 network in which all instruments that have detected faults are automatically included in the scan path, and a fault detection and localization module in hardware that detects the configuration of the network after self-reconfiguration and extracts the error codes reported by the fault monitoring instruments. To enable self-reconfiguration, we propose a modified segment insertion bit (SIB) compliant to IEEE 1687. We provide time analyses on fault detection and fault localization...
Effective self-repairing can be achieved if the fault along with its exact location can be determine...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
Efficient handling of faults during operation is highly dependent on the interval (latency) from the...
The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instrumen...
The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instrumen...
Due to the increasing usage of embedded instruments in many electronic devices, new solutions to eff...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing numbe...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
To meet the constant demand for performance, it is increasingly common with multi-processor system- ...
The IEEE 1687 standard introduces several novelties, most notably Reconfigurable Scan Networks (RSNs...
With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large n...
Effective self-repairing can be achieved if the fault along with its exact location can be determine...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...
Efficient handling of faults during operation is highly dependent on the interval (latency) from the...
The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instrumen...
The IEEE 1687 standard describes reconfigurable structures allowing to flexibly access the instrumen...
Due to the increasing usage of embedded instruments in many electronic devices, new solutions to eff...
IEEE 1687 enables flexible access to the embedded (on-chip) instruments that are needed for post-sil...
The continuous development in silicon manufacturing technologies and the increased reliance on desig...
IEEE 1687 (IJTAG) has been developed to enable flexible and automated access to the increasing numbe...
As transistors in integrated circuits (ICs) are becoming smaller, faster and more, it has become har...
Modern integrated circuits (ICs) include thousands of on-chip instruments to ensure that specificati...
To meet the constant demand for performance, it is increasingly common with multi-processor system- ...
The IEEE 1687 standard introduces several novelties, most notably Reconfigurable Scan Networks (RSNs...
With the complexity of nanoelectronic devices rapidly increasing, an efficient way to handle large n...
Effective self-repairing can be achieved if the fault along with its exact location can be determine...
The ever-shrinking technology features have as a direct consequence the increase of defect density i...
Modern systems-on-chips rely on embedded instruments for testing and debugging, the same instruments...