Development and characterisation of traceable force measurement for nanotechnology

Traceable low force metrology should be an essential tool for nanotechnology. Traceable measurement of micro- and nanonewton forces would allow independent measurement and comparison on material properties, MEMS behaviour and nanodimensional measurement uncertainties. Yet the current traceability infrastructure in the UK is incomplete. This thesis describes the incremental development of the low force facility at the National Physical Laboratory (NPL). The novel contribution of this thesis has three components. First, specific modifications to the NPL Low Force Balance were undertaken. This involved developing novel or highly modified solutions to address key issues, as well as undertaking detailed comparions with external ans internal traceability references. Second, a triskelion force sensor flexure was proposed and mathematically modelled using both analytical and finite element techniques, and compared to experimentally measured spring constant estimates. The models compared satisfactorily, though fabrication defects in developed prototype artefacts limited the experimental confirmation of the models. Third, a piezoelectric sensor approach for quasistatic force measurement was proposed, experimentally evaluated and rejected. Finally, an improved design for a low force transfer artefact system is presented, harnessing the findings of the reported investigations. The proposed design combines proven strain-sensing technology with the advantageous triskelion flexure, incorporating an external stage and packaging aspects to achieve the requirements for a traceable low force transfer artefact